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dc.contributor.authorJang, Jiseong-
dc.contributor.authorLee, Jun Su-
dc.contributor.authorHong, Ki-Ha-
dc.contributor.authorLee, Doh-Kwon-
dc.contributor.authorSong, Soomin-
dc.contributor.authorKim, Kihwan-
dc.contributor.authorEo, Young-Joo-
dc.contributor.authorYun, Jae Ho-
dc.contributor.authorChung, Choong-Heui-
dc.date.accessioned2024-01-20T00:31:16Z-
dc.date.available2024-01-20T00:31:16Z-
dc.date.created2021-09-05-
dc.date.issued2017-10-
dc.identifier.issn0927-0248-
dc.identifier.urihttps://pubs.kist.re.kr/handle/201004/122204-
dc.description.abstractWe quantitatively and analytically investigate the properties of buffer/window junctions and their effects on the energy band alignment and the current-voltage characteristics of Cu(In,Ga)Se-2 (CIGS) thin film solar cells with solution processed silver nanowire (AgNW) composite window layers. AgNWs are generally embedded in a moderately conductive matrix layer to ensure lateral collection efficiency of charge carriers photogenerated in the lateral gaps present between AgNWs. Studies on the junctions between a buffer and AgNW-composite window layers and their effects on the performances of CIGS thin film solar cells have seldom been addressed. Here, we show that solution processed AgNW-composite window layers could induce defect states at the buffer/window interface, resulting in poor energy band alignment impeding carrier transport in the solar cells. On the basis of our analysis, we suggest an analytical expression of n(matrix)/D-i(2) >= 3046x10(-5)/epsilon to avoid losses in the power conversion efficiency of the solar cells. n(matrix) is the carrier concentration in a matrix layer embedding AgNWs, D-i is the negative defect density at the buffer/window interface, and epsilon is the relative dielectric constant of the matrix layer embedding AgNWs.-
dc.languageEnglish-
dc.publisherELSEVIER SCIENCE BV-
dc.subjectELECTRODE-
dc.subjectBEHAVIOR-
dc.subjectOXIDE-
dc.titleCu(In,Ga)Se-2 thin film solar cells with solution processed silver nanowire composite window layers: Buffer/window junctions and their effects-
dc.typeArticle-
dc.identifier.doi10.1016/j.solmat.2017.05.051-
dc.description.journalClass1-
dc.identifier.bibliographicCitationSOLAR ENERGY MATERIALS AND SOLAR CELLS, v.170, pp.60 - 67-
dc.citation.titleSOLAR ENERGY MATERIALS AND SOLAR CELLS-
dc.citation.volume170-
dc.citation.startPage60-
dc.citation.endPage67-
dc.description.journalRegisteredClassscie-
dc.description.journalRegisteredClassscopus-
dc.identifier.wosid000405155000009-
dc.identifier.scopusid2-s2.0-85020030372-
dc.relation.journalWebOfScienceCategoryEnergy & Fuels-
dc.relation.journalWebOfScienceCategoryMaterials Science, Multidisciplinary-
dc.relation.journalWebOfScienceCategoryPhysics, Applied-
dc.relation.journalResearchAreaEnergy & Fuels-
dc.relation.journalResearchAreaMaterials Science-
dc.relation.journalResearchAreaPhysics-
dc.type.docTypeArticle-
dc.subject.keywordPlusELECTRODE-
dc.subject.keywordPlusBEHAVIOR-
dc.subject.keywordPlusOXIDE-
dc.subject.keywordAuthorCIGS solar cells-
dc.subject.keywordAuthorSilver nanowire-
dc.subject.keywordAuthorBuffer/window junction-
dc.subject.keywordAuthorInterfacial defect-
dc.subject.keywordAuthorKink-
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KIST Article > 2017
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