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dc.contributor.authorPark, J.S.-
dc.contributor.authorKoo, S.-M.-
dc.contributor.authorKim, C.H.-
dc.date.accessioned2024-01-20T03:34:46Z-
dc.date.available2024-01-20T03:34:46Z-
dc.date.created2021-09-02-
dc.date.issued2016-08-
dc.identifier.issn1975-8359-
dc.identifier.urihttps://pubs.kist.re.kr/handle/201004/123859-
dc.description.abstractElectrical impedance tomography (EIT) has been applied to measure the location of external disturbance using a phantom and conductive yarns. According to the test results, the addition of carbon nanotube particles into the phantom does not show remarkable improvement in location errors. On the other hand combined fabric, conductive yarns with fabric, and non-woven fabric, were added to evaluate its performance as a fabric sensor. The combined fabric resulted in a decrease of 21.5% in the circumferential location error and a decrease of 50% in the radial location error, compared to those of the yarns. Additionally, it was revealed that the measurement error is almost linearly proportional to the conductivity of the phantom liquid and resistance of the conductive yarns. The combined fabric can be a promising material for fabric sensors in sports utilities and medical devices. Copyright ? The Korean Institute of Electrical Engineers.-
dc.languageKorean-
dc.publisherKorean Institute of Electrical Engineers-
dc.subjectAlgorithms-
dc.subjectBiomedical equipment-
dc.subjectCarbon-
dc.subjectCarbon nanotubes-
dc.subjectElectric impedance-
dc.subjectElectric impedance measurement-
dc.subjectElectric impedance tomography-
dc.subjectErrors-
dc.subjectInverse problems-
dc.subjectLocation-
dc.subjectMeasurement errors-
dc.subjectSmart textiles-
dc.subjectTomography-
dc.subjectYarn-
dc.subjectCircumferential location-
dc.subjectConductive yarns-
dc.subjectElectrical impe dance tomography (EIT)-
dc.subjectExternal disturbances-
dc.subjectLinearly proportional-
dc.subjectPhantom-
dc.subjectPhantom liquids-
dc.subjectRadial locations-
dc.subjectWeaving-
dc.titleMeasurement errors of the EIT systems using a phantom and conductive yarns-
dc.typeArticle-
dc.identifier.doi10.5370/KIEE.2016.65.8.1430-
dc.description.journalClass1-
dc.identifier.bibliographicCitationTransactions of the Korean Institute of Electrical Engineers, v.65, no.8, pp.1430 - 1435-
dc.citation.titleTransactions of the Korean Institute of Electrical Engineers-
dc.citation.volume65-
dc.citation.number8-
dc.citation.startPage1430-
dc.citation.endPage1435-
dc.description.journalRegisteredClassscopus-
dc.description.journalRegisteredClasskci-
dc.identifier.kciidART002132021-
dc.identifier.scopusid2-s2.0-84988835552-
dc.type.docTypeArticle-
dc.subject.keywordPlusAlgorithms-
dc.subject.keywordPlusBiomedical equipment-
dc.subject.keywordPlusCarbon-
dc.subject.keywordPlusCarbon nanotubes-
dc.subject.keywordPlusElectric impedance-
dc.subject.keywordPlusElectric impedance measurement-
dc.subject.keywordPlusElectric impedance tomography-
dc.subject.keywordPlusErrors-
dc.subject.keywordPlusInverse problems-
dc.subject.keywordPlusLocation-
dc.subject.keywordPlusMeasurement errors-
dc.subject.keywordPlusSmart textiles-
dc.subject.keywordPlusTomography-
dc.subject.keywordPlusYarn-
dc.subject.keywordPlusCircumferential location-
dc.subject.keywordPlusConductive yarns-
dc.subject.keywordPlusElectrical impe dance tomography (EIT)-
dc.subject.keywordPlusExternal disturbances-
dc.subject.keywordPlusLinearly proportional-
dc.subject.keywordPlusPhantom-
dc.subject.keywordPlusPhantom liquids-
dc.subject.keywordPlusRadial locations-
dc.subject.keywordPlusWeaving-
dc.subject.keywordAuthorAlgorithm-
dc.subject.keywordAuthorElectrical impedance tomography (EIT)-
dc.subject.keywordAuthorInverse problem-
dc.subject.keywordAuthorPhantom-
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KIST Article > 2016
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