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dc.contributor.authorKumar, Shalendra-
dc.contributor.authorPark, J. S.-
dc.contributor.authorKim, D. J.-
dc.contributor.authorLee, M. H.-
dc.contributor.authorSong, Tae Kwon-
dc.contributor.authorGautam, Sanjeev-
dc.contributor.authorChae, K. H.-
dc.contributor.authorKim, S. S.-
dc.contributor.authorKim, M. -H.-
dc.date.accessioned2024-01-20T06:00:18Z-
dc.date.available2024-01-20T06:00:18Z-
dc.date.created2021-09-05-
dc.date.issued2015-11-
dc.identifier.issn0272-8842-
dc.identifier.urihttps://pubs.kist.re.kr/handle/201004/124832-
dc.description.abstractThe thin film of Ti0.93Co0.05O2-delta has been grown on LaAlO3 (100) substrate using pulsed laser deposition method. X-ray diffraction, near-edge X-ray absorption fine structure (NEXAFS) spectroscopy, X-ray magnetic circular dichroism (XMCD) and magnetic hysteresis loop measurements were used to fully understand the origin of ferromagnetism. Our structural analysis reveals a single phase nature of the film and excludes the presence of any secondary phase. NEXAFS spectra collected at Ti L-3,L-2, and Co L-3,L-2 -edge infer that Co and Ti ions are in 2+ and 4+ valence states, respectively. Multiplet calculation performed at Co L-3,L-2 -edge also support the experimental observations and shows that Co ions are in 2+ valence state in O-h (octahedral) symmetry. Zero field cooled and field cooled magnetization infer that T-C of Ti0.95Co0.05O2-delta film is above room temperature. DC magnetization hysteresis loop study and XMCD measurement at Co L-3,L-2 -edge reflect that Ti0.95Co0.05O2-delta film exhibits ferromagnetic ordering at room temperature. (C) 2015 Elsevier Ltd and Techna Group S.r.l. All rights reserved.-
dc.languageEnglish-
dc.publisherELSEVIER SCI LTD-
dc.subjectROOM-TEMPERATURE FERROMAGNETISM-
dc.titleElectronic structure and magnetic properties of Co doped TiO2 thin films using X-ray absorption spectroscopy-
dc.typeArticle-
dc.identifier.doi10.1016/j.ceramint.2015.03.209-
dc.description.journalClass1-
dc.identifier.bibliographicCitationCERAMICS INTERNATIONAL, v.41, pp.S370 - S375-
dc.citation.titleCERAMICS INTERNATIONAL-
dc.citation.volume41-
dc.citation.startPageS370-
dc.citation.endPageS375-
dc.description.journalRegisteredClassscie-
dc.description.journalRegisteredClassscopus-
dc.identifier.wosid000358968100066-
dc.identifier.scopusid2-s2.0-84937518760-
dc.relation.journalWebOfScienceCategoryMaterials Science, Ceramics-
dc.relation.journalResearchAreaMaterials Science-
dc.type.docTypeArticle-
dc.subject.keywordPlusROOM-TEMPERATURE FERROMAGNETISM-
dc.subject.keywordAuthorMagnetic properties-
dc.subject.keywordAuthorElectronic material-
dc.subject.keywordAuthorThin film-
dc.subject.keywordAuthorPLD-
dc.subject.keywordAuthorNEXAFS-
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