Full metadata record
DC Field | Value | Language |
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dc.contributor.author | Kumar, Shalendra | - |
dc.contributor.author | Park, J. S. | - |
dc.contributor.author | Kim, D. J. | - |
dc.contributor.author | Lee, M. H. | - |
dc.contributor.author | Song, Tae Kwon | - |
dc.contributor.author | Gautam, Sanjeev | - |
dc.contributor.author | Chae, K. H. | - |
dc.contributor.author | Kim, S. S. | - |
dc.contributor.author | Kim, M. -H. | - |
dc.date.accessioned | 2024-01-20T06:00:18Z | - |
dc.date.available | 2024-01-20T06:00:18Z | - |
dc.date.created | 2021-09-05 | - |
dc.date.issued | 2015-11 | - |
dc.identifier.issn | 0272-8842 | - |
dc.identifier.uri | https://pubs.kist.re.kr/handle/201004/124832 | - |
dc.description.abstract | The thin film of Ti0.93Co0.05O2-delta has been grown on LaAlO3 (100) substrate using pulsed laser deposition method. X-ray diffraction, near-edge X-ray absorption fine structure (NEXAFS) spectroscopy, X-ray magnetic circular dichroism (XMCD) and magnetic hysteresis loop measurements were used to fully understand the origin of ferromagnetism. Our structural analysis reveals a single phase nature of the film and excludes the presence of any secondary phase. NEXAFS spectra collected at Ti L-3,L-2, and Co L-3,L-2 -edge infer that Co and Ti ions are in 2+ and 4+ valence states, respectively. Multiplet calculation performed at Co L-3,L-2 -edge also support the experimental observations and shows that Co ions are in 2+ valence state in O-h (octahedral) symmetry. Zero field cooled and field cooled magnetization infer that T-C of Ti0.95Co0.05O2-delta film is above room temperature. DC magnetization hysteresis loop study and XMCD measurement at Co L-3,L-2 -edge reflect that Ti0.95Co0.05O2-delta film exhibits ferromagnetic ordering at room temperature. (C) 2015 Elsevier Ltd and Techna Group S.r.l. All rights reserved. | - |
dc.language | English | - |
dc.publisher | ELSEVIER SCI LTD | - |
dc.subject | ROOM-TEMPERATURE FERROMAGNETISM | - |
dc.title | Electronic structure and magnetic properties of Co doped TiO2 thin films using X-ray absorption spectroscopy | - |
dc.type | Article | - |
dc.identifier.doi | 10.1016/j.ceramint.2015.03.209 | - |
dc.description.journalClass | 1 | - |
dc.identifier.bibliographicCitation | CERAMICS INTERNATIONAL, v.41, pp.S370 - S375 | - |
dc.citation.title | CERAMICS INTERNATIONAL | - |
dc.citation.volume | 41 | - |
dc.citation.startPage | S370 | - |
dc.citation.endPage | S375 | - |
dc.description.journalRegisteredClass | scie | - |
dc.description.journalRegisteredClass | scopus | - |
dc.identifier.wosid | 000358968100066 | - |
dc.identifier.scopusid | 2-s2.0-84937518760 | - |
dc.relation.journalWebOfScienceCategory | Materials Science, Ceramics | - |
dc.relation.journalResearchArea | Materials Science | - |
dc.type.docType | Article | - |
dc.subject.keywordPlus | ROOM-TEMPERATURE FERROMAGNETISM | - |
dc.subject.keywordAuthor | Magnetic properties | - |
dc.subject.keywordAuthor | Electronic material | - |
dc.subject.keywordAuthor | Thin film | - |
dc.subject.keywordAuthor | PLD | - |
dc.subject.keywordAuthor | NEXAFS | - |
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