Full metadata record
DC Field | Value | Language |
---|---|---|
dc.contributor.author | Jayanti, Sriharsha V. | - |
dc.contributor.author | Park, Jong Hyuk | - |
dc.contributor.author | Dejneka, Alexandr | - |
dc.contributor.author | Chvostova, Dagmar | - |
dc.contributor.author | McPeak, Kevin M. | - |
dc.contributor.author | Chen, Xiaoshu | - |
dc.contributor.author | Oh, Sang-Hyun | - |
dc.contributor.author | Norris, David J. | - |
dc.date.accessioned | 2024-01-20T07:03:13Z | - |
dc.date.available | 2024-01-20T07:03:13Z | - |
dc.date.created | 2021-09-04 | - |
dc.date.issued | 2015-05-01 | - |
dc.identifier.issn | 2159-3930 | - |
dc.identifier.uri | https://pubs.kist.re.kr/handle/201004/125464 | - |
dc.description.abstract | While plasmonic metals can manipulate optical energy at the nanoscale, they suffer from significant losses at visible wavelengths. We investigate the potential of low temperature to decrease such losses in optically thick Ag films. We extract the complex dielectric function (or relative permittivity) from spectroscopic ellipsometry measurements for smooth single-crystalline, smooth polycrystalline, and rough polycrystalline films down to liquid-helium temperatures and fit these data to a temperature-dependent Drude model. Smooth single-crystalline films exhibited the largest improvements relative to room temperature. Below 50 K, the surface plasmon polariton propagation lengths increased by similar to 50% at 650 nm. In rough polycrystalline films, improvements of 10% are expected. (C) 2015 Optical Society of America | - |
dc.language | English | - |
dc.publisher | OPTICAL SOC AMER | - |
dc.subject | ELECTRON-ELECTRON SCATTERING | - |
dc.subject | INTRABAND OPTICAL CONDUCTIVITY | - |
dc.subject | NOBLE-METALS | - |
dc.subject | INFRARED ABSORPTIVITY | - |
dc.subject | AU | - |
dc.subject | AG | - |
dc.subject | CU | - |
dc.subject | NANOSTRUCTURES | - |
dc.subject | METAMATERIALS | - |
dc.subject | RESISTIVITY | - |
dc.title | Low-temperature enhancement of plasmonic performance in silver films | - |
dc.type | Article | - |
dc.identifier.doi | 10.1364/OME.5.001147 | - |
dc.description.journalClass | 1 | - |
dc.identifier.bibliographicCitation | OPTICAL MATERIALS EXPRESS, v.5, no.5, pp.1147 - 1155 | - |
dc.citation.title | OPTICAL MATERIALS EXPRESS | - |
dc.citation.volume | 5 | - |
dc.citation.number | 5 | - |
dc.citation.startPage | 1147 | - |
dc.citation.endPage | 1155 | - |
dc.description.journalRegisteredClass | scie | - |
dc.description.journalRegisteredClass | scopus | - |
dc.identifier.wosid | 000353922700023 | - |
dc.identifier.scopusid | 2-s2.0-84929379295 | - |
dc.relation.journalWebOfScienceCategory | Materials Science, Multidisciplinary | - |
dc.relation.journalWebOfScienceCategory | Optics | - |
dc.relation.journalResearchArea | Materials Science | - |
dc.relation.journalResearchArea | Optics | - |
dc.type.docType | Article | - |
dc.subject.keywordPlus | ELECTRON-ELECTRON SCATTERING | - |
dc.subject.keywordPlus | INTRABAND OPTICAL CONDUCTIVITY | - |
dc.subject.keywordPlus | NOBLE-METALS | - |
dc.subject.keywordPlus | INFRARED ABSORPTIVITY | - |
dc.subject.keywordPlus | AU | - |
dc.subject.keywordPlus | AG | - |
dc.subject.keywordPlus | CU | - |
dc.subject.keywordPlus | NANOSTRUCTURES | - |
dc.subject.keywordPlus | METAMATERIALS | - |
dc.subject.keywordPlus | RESISTIVITY | - |
dc.subject.keywordAuthor | Surface plasmons | - |
dc.subject.keywordAuthor | Ellipsometry and polarimetry | - |
dc.subject.keywordAuthor | Materials and process characterization | - |
dc.subject.keywordAuthor | Metals | - |
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