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dc.contributor.author조진우-
dc.contributor.author김성훈-
dc.contributor.author변영운-
dc.contributor.author안재평-
dc.date.accessioned2024-01-20T08:02:09Z-
dc.date.available2024-01-20T08:02:09Z-
dc.date.created2022-01-10-
dc.date.issued2015-01-
dc.identifier.issn1738-7507-
dc.identifier.urihttps://pubs.kist.re.kr/handle/201004/125903-
dc.publisher대한금속재료학회 (구 대한금속학회)-
dc.title전자현미경 기반의 차세대 핵심 나노분석기술-
dc.typeArticle-
dc.description.journalClass3-
dc.identifier.bibliographicCitation재료마당 = Trends in metals & materials engineering, v.28, no.1, pp.24 - 41-
dc.citation.title재료마당 = Trends in metals & materials engineering-
dc.citation.volume28-
dc.citation.number1-
dc.citation.startPage24-
dc.citation.endPage41-
dc.description.isOpenAccessN-
dc.subject.keywordAuthorTEM-
dc.subject.keywordAuthorAtom Probe-
dc.subject.keywordAuthorHysitron-
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KIST Article > 2015
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