Full metadata record
DC Field | Value | Language |
---|---|---|
dc.contributor.author | Kim, Kyongmin | - |
dc.contributor.author | Kim, Eunkyeom | - |
dc.contributor.author | Kim, Youngill | - |
dc.contributor.author | Park, Kyoungwan | - |
dc.date.accessioned | 2024-01-20T10:31:47Z | - |
dc.date.available | 2024-01-20T10:31:47Z | - |
dc.date.created | 2022-01-25 | - |
dc.date.issued | 2014-02 | - |
dc.identifier.issn | 1738-8228 | - |
dc.identifier.uri | https://pubs.kist.re.kr/handle/201004/127124 | - |
dc.description.abstract | We synthesized a gel-like phase of zinc oxide (ZnO) by employing a microwave-assisted technique and then used this gel-like phase to fabricate ZnO thin film transistors (TFTs). By utilizing this method, we were able to prepare the ZnO gel-like phase in a relatively short time and obtained polycrystalline ZnO thin films This microwave-assisted technique also allows the use of low-temperature thermal processes in the fabrication of ZnO-TFTs. The bottom-gate TFTs with a ZnO layer as the active channel exhibited a field effect mobility of 0.6 cm(2)/V.s, a sub-threshold slope of 9 V/decade, and an on/off current ratio greater than 10(4). These results point to the possibility of using microwave-assisted techniques for transparent and flexible electronic devices based on ZnO. | - |
dc.language | English | - |
dc.publisher | KOREAN INST METALS MATERIALS | - |
dc.title | Characteristics of ZnO Thin Film Transistors Fabricated Using a Microwave Sol-Gel Method | - |
dc.type | Article | - |
dc.identifier.doi | 10.3365/KJMM.2014.52.2.155 | - |
dc.description.journalClass | 1 | - |
dc.identifier.bibliographicCitation | KOREAN JOURNAL OF METALS AND MATERIALS, v.52, no.2, pp.155 - 161 | - |
dc.citation.title | KOREAN JOURNAL OF METALS AND MATERIALS | - |
dc.citation.volume | 52 | - |
dc.citation.number | 2 | - |
dc.citation.startPage | 155 | - |
dc.citation.endPage | 161 | - |
dc.description.isOpenAccess | N | - |
dc.description.journalRegisteredClass | scie | - |
dc.description.journalRegisteredClass | scopus | - |
dc.description.journalRegisteredClass | kci | - |
dc.identifier.kciid | ART001849050 | - |
dc.identifier.wosid | 000331346900009 | - |
dc.identifier.scopusid | 2-s2.0-84896871692 | - |
dc.relation.journalWebOfScienceCategory | Materials Science, Multidisciplinary | - |
dc.relation.journalWebOfScienceCategory | Metallurgy & Metallurgical Engineering | - |
dc.relation.journalResearchArea | Materials Science | - |
dc.relation.journalResearchArea | Metallurgy & Metallurgical Engineering | - |
dc.type.docType | Article | - |
dc.subject.keywordPlus | TEMPERATURE | - |
dc.subject.keywordPlus | DEPOSITION | - |
dc.subject.keywordAuthor | ZnO | - |
dc.subject.keywordAuthor | semiconductors | - |
dc.subject.keywordAuthor | sol-gel | - |
dc.subject.keywordAuthor | electrical properties | - |
dc.subject.keywordAuthor | TEM | - |
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