Roughness-based monitoring of transparency and conductivity in boron-doped ZnO thin films prepared by spray pyrolysis

Authors
Gaikwad, Rajendra S.Bhande, Sambhaji S.Mane, Rajaram S.Pawar, Bhagwat N.Gaikwad, Sanjay L.Han, Sung-HwanJoo, Oh-Shim
Issue Date
2012-12
Publisher
PERGAMON-ELSEVIER SCIENCE LTD
Citation
MATERIALS RESEARCH BULLETIN, v.47, no.12, pp.4257 - 4262
Abstract
Sprayed polycrystalline ZnO and boron-doped ZnO thin films composed of spherical grains of 25-32 nm in diameters are used in roughness measurement and further correlated with the transparency and the conductivity characteristics. The surface roughness is increased up to Zn0.98B0.02O and then declined at higher boron concentrations. The sprayed ZnO films revealed >= 95% transmittance in the visible wavelength range, 1.956 x 10(-4) Omega cm electrical resistivity, 46 cm(2)/V s Hall mobility and 9.21 x 10(21) cm(-3) charge carrier concentration. The X-ray photoelectron spectroscopy study has confirmed 0.15 eV binding energy change for Zn 2p(3/2) when 2 at% boron content is mixed without altering electro-optical properties substantially. Finally, using soft modeling importance of these textured ZnO over non-textured films for enhancing the solar cells performance is explored. (C) 2012 Elsevier Ltd. All rights reserved.
Keywords
CHEMICAL-VAPOR-DEPOSITION; PULSED-LASER DEPOSITION; SILICON SOLAR-CELLS; HIGH ADHESIVE FORCE; OPTICAL-PROPERTIES; ELECTRICAL-PROPERTIES; AQUEOUS-SOLUTION; OXIDE-FILMS; ZINC; PHOTODETECTORS; Thin films; Optical materials; Chemical synthesis; X-ray diffraction
ISSN
0025-5408
URI
https://pubs.kist.re.kr/handle/201004/128626
DOI
10.1016/j.materresbull.2012.09.022
Appears in Collections:
KIST Article > 2012
Files in This Item:
There are no files associated with this item.
Export
RIS (EndNote)
XLS (Excel)
XML

qrcode

Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.

BROWSE