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dc.contributor.authorHalverson, Adam F.-
dc.contributor.authorZhu, Kai-
dc.contributor.authorErslev, Peter T.-
dc.contributor.authorKim, Jin Young-
dc.contributor.authorNeale, Nathan R.-
dc.contributor.authorFrank, Arthur J.-
dc.date.accessioned2024-01-20T15:04:20Z-
dc.date.available2024-01-20T15:04:20Z-
dc.date.created2021-08-31-
dc.date.issued2012-04-
dc.identifier.issn1530-6984-
dc.identifier.urihttps://pubs.kist.re.kr/handle/201004/129419-
dc.description.abstractThis study addresses a long-standing controversy about the electron-transport mechanism in porous metal oxide semiconductor films that are commonly used in dye-sensitized solar cells and related systems. We investigated, by temperature-dependent time-of-flight measurements, the influence of proton intercalation on the electron-transport properties of nanoporous TiO2 films exposed to an ethanol electrolyte containing different percentages of water (0-10%). These measurements revealed that increasing the water content in the electrolyte led to increased proton intercalation into the TiO2 films, slower transport, and a dramatic change in the dependence of the thermal activation energy (E-a) of the electron diffusion coefficient on the photogenerated electron density in the films. Random walk simulations based on a microscopic model incorporating exponential conduction band tail (CBT) trap states combined with a proton-induced shallow trap level with a long residence time accounted for the observed effects of proton intercalation on E-a. Application of this model to the experimental results explains the conditions under which E-a dependence on the photoelectron density is consistent with multiple trapping in exponential CBT states and under which it appears at variance with this model.-
dc.languageEnglish-
dc.publisherAMER CHEMICAL SOC-
dc.subjectSENSITIZED SOLAR-CELLS-
dc.subjectNANOSTRUCTURED TIO2-
dc.subjectPHOTOVOLTAIC PROPERTIES-
dc.subjectACTIVATION-ENERGIES-
dc.subjectHYDROGEN-
dc.subjectRECOMBINATION-
dc.subjectEDGE-
dc.subjectBAND-
dc.subjectTEMPERATURE-
dc.subjectINSULATORS-
dc.titlePerturbation of the Electron Transport Mechanism by Proton Intercalation in Nanoporous TiO2 Films-
dc.typeArticle-
dc.identifier.doi10.1021/nl300399w-
dc.description.journalClass1-
dc.identifier.bibliographicCitationNANO LETTERS, v.12, no.4, pp.2112 - 2116-
dc.citation.titleNANO LETTERS-
dc.citation.volume12-
dc.citation.number4-
dc.citation.startPage2112-
dc.citation.endPage2116-
dc.description.journalRegisteredClassscie-
dc.description.journalRegisteredClassscopus-
dc.identifier.wosid000302524600062-
dc.relation.journalWebOfScienceCategoryChemistry, Multidisciplinary-
dc.relation.journalWebOfScienceCategoryChemistry, Physical-
dc.relation.journalWebOfScienceCategoryNanoscience & Nanotechnology-
dc.relation.journalWebOfScienceCategoryMaterials Science, Multidisciplinary-
dc.relation.journalWebOfScienceCategoryPhysics, Applied-
dc.relation.journalWebOfScienceCategoryPhysics, Condensed Matter-
dc.relation.journalResearchAreaChemistry-
dc.relation.journalResearchAreaScience & Technology - Other Topics-
dc.relation.journalResearchAreaMaterials Science-
dc.relation.journalResearchAreaPhysics-
dc.type.docTypeArticle-
dc.subject.keywordPlusSENSITIZED SOLAR-CELLS-
dc.subject.keywordPlusNANOSTRUCTURED TIO2-
dc.subject.keywordPlusPHOTOVOLTAIC PROPERTIES-
dc.subject.keywordPlusACTIVATION-ENERGIES-
dc.subject.keywordPlusHYDROGEN-
dc.subject.keywordPlusRECOMBINATION-
dc.subject.keywordPlusEDGE-
dc.subject.keywordPlusBAND-
dc.subject.keywordPlusTEMPERATURE-
dc.subject.keywordPlusINSULATORS-
dc.subject.keywordAuthorProton intercalation-
dc.subject.keywordAuthornanoporous TiO2 films-
dc.subject.keywordAuthorelectron transport-
dc.subject.keywordAuthoractivation energy-
dc.subject.keywordAuthortime-of-flight-
dc.subject.keywordAuthorrandom walk simulation-
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