Full metadata record
DC Field | Value | Language |
---|---|---|
dc.contributor.author | Kim, Woo-Young | - |
dc.contributor.author | Palve, Balasaheb M. | - |
dc.contributor.author | Pathan, Habib M. | - |
dc.contributor.author | Joo, Oh-Shim | - |
dc.date.accessioned | 2024-01-20T15:34:52Z | - |
dc.date.available | 2024-01-20T15:34:52Z | - |
dc.date.created | 2021-09-05 | - |
dc.date.issued | 2011-12-15 | - |
dc.identifier.issn | 0254-0584 | - |
dc.identifier.uri | https://pubs.kist.re.kr/handle/201004/129716 | - |
dc.description.abstract | Polycrystalline copper sulfide (Cu2S) thin films were deposited by spray pyrolysis using aqueous solutions of copper nitrate and thiourea without any complexing agent at substrate (deposition) temperature of similar to 200 degrees C. The films were deposited onto glass and ITO-coated glass substrates. The deposited films were observed to be blackish brown in color, well adherent to the substrate, pin-hole free and uniform. The structural, surface morphological and optical properties of the films were carried out by means of X-ray diffraction, scanning electron microscopy and optical absorbance measurement techniques. XRD analysis showed that deposited films are chemically close to chalcocite, Cu2S. The optical band gap was calculated to be 1.5 eV. (C) 2011 Elsevier B.V. All rights reserved. | - |
dc.language | English | - |
dc.publisher | ELSEVIER SCIENCE SA | - |
dc.subject | OPTICAL-PROPERTIES | - |
dc.subject | NANOPARTICLES | - |
dc.subject | CU(X)S | - |
dc.title | Spray pyrolytic deposition of polycrystalline Cu2S thin films | - |
dc.type | Article | - |
dc.identifier.doi | 10.1016/j.matchemphys.2011.10.015 | - |
dc.description.journalClass | 1 | - |
dc.identifier.bibliographicCitation | MATERIALS CHEMISTRY AND PHYSICS, v.131, no.1-2, pp.525 - 528 | - |
dc.citation.title | MATERIALS CHEMISTRY AND PHYSICS | - |
dc.citation.volume | 131 | - |
dc.citation.number | 1-2 | - |
dc.citation.startPage | 525 | - |
dc.citation.endPage | 528 | - |
dc.description.journalRegisteredClass | scie | - |
dc.description.journalRegisteredClass | scopus | - |
dc.identifier.wosid | 000298764800082 | - |
dc.identifier.scopusid | 2-s2.0-84864290212 | - |
dc.relation.journalWebOfScienceCategory | Materials Science, Multidisciplinary | - |
dc.relation.journalResearchArea | Materials Science | - |
dc.type.docType | Article | - |
dc.subject.keywordPlus | OPTICAL-PROPERTIES | - |
dc.subject.keywordPlus | NANOPARTICLES | - |
dc.subject.keywordPlus | CU(X)S | - |
dc.subject.keywordAuthor | Thin films | - |
dc.subject.keywordAuthor | Chemical synthesis | - |
dc.subject.keywordAuthor | Crystal structure | - |
dc.subject.keywordAuthor | Electron microscopy | - |
Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.