Full metadata record
DC Field | Value | Language |
---|---|---|
dc.contributor.author | Kamat, Sandip V. | - |
dc.contributor.author | Yadav, J. B. | - |
dc.contributor.author | Puri, Vijaya | - |
dc.contributor.author | Puri, R. K. | - |
dc.contributor.author | Joo, O. S. | - |
dc.date.accessioned | 2024-01-20T16:03:30Z | - |
dc.date.available | 2024-01-20T16:03:30Z | - |
dc.date.created | 2021-09-05 | - |
dc.date.issued | 2011-10-15 | - |
dc.identifier.issn | 0169-4332 | - |
dc.identifier.uri | https://pubs.kist.re.kr/handle/201004/129885 | - |
dc.description.abstract | Poly (3-methyl thiophene) thin films were prepared by chemical bath deposition technique on glass substrate; the prepared thin films were characterized for structural, morphological and optical properties. The variation in the oxidant concentration has an influence on the properties of the P3MeT thin films. The increase in the oxidant concentration leads to increase in the thickness of the film. The binding energy increases due to increase in oxidation concentration. The P3MeT thin films show smooth surface morphology with increase in oxidant concentration whereas the contact angle of the thin film decreases with increase in oxidant concentration. The optical absorbance of these thin films was found to increase with decrease in the optical band gap due to increase in oxidant concentration. (C) 2011 Elsevier B.V. All rights reserved. | - |
dc.language | English | - |
dc.publisher | ELSEVIER | - |
dc.subject | TEMPERATURE | - |
dc.subject | XPS | - |
dc.title | Characterization of poly (3-methyl thiophene) thin films prepared by modified chemical bath deposition | - |
dc.type | Article | - |
dc.identifier.doi | 10.1016/j.apsusc.2011.08.084 | - |
dc.description.journalClass | 1 | - |
dc.identifier.bibliographicCitation | APPLIED SURFACE SCIENCE, v.258, no.1, pp.482 - 488 | - |
dc.citation.title | APPLIED SURFACE SCIENCE | - |
dc.citation.volume | 258 | - |
dc.citation.number | 1 | - |
dc.citation.startPage | 482 | - |
dc.citation.endPage | 488 | - |
dc.description.journalRegisteredClass | scie | - |
dc.description.journalRegisteredClass | scopus | - |
dc.identifier.wosid | 000296492500081 | - |
dc.identifier.scopusid | 2-s2.0-80054742848 | - |
dc.relation.journalWebOfScienceCategory | Chemistry, Physical | - |
dc.relation.journalWebOfScienceCategory | Materials Science, Coatings & Films | - |
dc.relation.journalWebOfScienceCategory | Physics, Applied | - |
dc.relation.journalWebOfScienceCategory | Physics, Condensed Matter | - |
dc.relation.journalResearchArea | Chemistry | - |
dc.relation.journalResearchArea | Materials Science | - |
dc.relation.journalResearchArea | Physics | - |
dc.type.docType | Article | - |
dc.subject.keywordPlus | TEMPERATURE | - |
dc.subject.keywordPlus | XPS | - |
dc.subject.keywordAuthor | Polymer | - |
dc.subject.keywordAuthor | Thin films | - |
dc.subject.keywordAuthor | Chemical synthesis | - |
dc.subject.keywordAuthor | XPS | - |
dc.subject.keywordAuthor | Optical properties | - |
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