Full metadata record
DC Field | Value | Language |
---|---|---|
dc.contributor.author | Park, Dong-Hee | - |
dc.contributor.author | Choi, Won-Kook | - |
dc.date.accessioned | 2024-01-20T21:30:56Z | - |
dc.date.available | 2024-01-20T21:30:56Z | - |
dc.date.created | 2021-09-03 | - |
dc.date.issued | 2009-05-29 | - |
dc.identifier.issn | 0040-6090 | - |
dc.identifier.uri | https://pubs.kist.re.kr/handle/201004/132473 | - |
dc.description.abstract | To enhance the weak mechanical durability of directly deposited copper layers on polyimide (PI) film due to their poor adhesive strength, a continuous roll-to-roll process involving surface modification using a reactive ion beam irradiation and in-situ deposition process is studied. The polyimide film is modified by an ion source with a linear stationary plasma thruster (LSPT) in the vacuum roll-to-roll process. An O-2 ion beam, with beam energy of 214 eV and beam current density of 0.78 mA/cm(2), and N2O ion beam, with 220 eV and 0.69 mA/cm(2), irradiate PI film in winding speed of 0.5 m/min. The surface energy increases from 38 mN/m for the pristine PI film to 80 mN/m after beam irradiation at an ion fluence of 3.5 x 10(16) ions/s. After beam irradiation, a 10 nm thick tie layer and 200 nm thick copper layer are successively deposited by in-situ DC magnetron web coating. The peel strength of the copper layer on the PI film is enhanced from 0.4 kgf/cm without ion beam treatment to 0.71 kgf/cm after O-2 beam treatment and to 0.75 kgf/cm after N2O beam treatment. This enhancement is closely related to the increase in the polar force originating from the formation of hydrophilic C=O (carbonyl) groups on the modified PI surface. (C) 2009 Elsevier B.V. All rights reserved. | - |
dc.language | English | - |
dc.publisher | ELSEVIER SCIENCE SA | - |
dc.subject | PLASMA | - |
dc.subject | FILM | - |
dc.title | Low energy O-2(+) and N2O+ ion beam modification of polyimide for improving adhesive strength of Cu/PI in roll-to-roll process | - |
dc.type | Article | - |
dc.identifier.doi | 10.1016/j.tsf.2009.02.041 | - |
dc.description.journalClass | 1 | - |
dc.identifier.bibliographicCitation | THIN SOLID FILMS, v.517, no.14, pp.4222 - 4225 | - |
dc.citation.title | THIN SOLID FILMS | - |
dc.citation.volume | 517 | - |
dc.citation.number | 14 | - |
dc.citation.startPage | 4222 | - |
dc.citation.endPage | 4225 | - |
dc.description.journalRegisteredClass | scie | - |
dc.description.journalRegisteredClass | scopus | - |
dc.identifier.wosid | 000266696100099 | - |
dc.identifier.scopusid | 2-s2.0-65449140851 | - |
dc.relation.journalWebOfScienceCategory | Materials Science, Multidisciplinary | - |
dc.relation.journalWebOfScienceCategory | Materials Science, Coatings & Films | - |
dc.relation.journalWebOfScienceCategory | Physics, Applied | - |
dc.relation.journalWebOfScienceCategory | Physics, Condensed Matter | - |
dc.relation.journalResearchArea | Materials Science | - |
dc.relation.journalResearchArea | Physics | - |
dc.type.docType | Article; Proceedings Paper | - |
dc.subject.keywordPlus | PLASMA | - |
dc.subject.keywordPlus | FILM | - |
dc.subject.keywordAuthor | Copper on polyimide | - |
dc.subject.keywordAuthor | Linear stationary plasma thruster | - |
dc.subject.keywordAuthor | Ion beam | - |
dc.subject.keywordAuthor | Peel strength | - |
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