Microstructural and textural characterization in MgO thin film using HRTEM

Authors
Kim, Kyou-HyunLee, Min-SukChoi, Jong-SeoAhn, Jae-Pyoung
Issue Date
2009-05-29
Publisher
ELSEVIER SCIENCE SA
Citation
THIN SOLID FILMS, v.517, no.14, pp.3995 - 3998
Abstract
The microstructural and texture evolution of MgO protective films deposited on Si and glass substrates by ebeam evaporation were investigated. MgO films on both types of substrates consisted of a well developed columnar structure showing < 111 > texture in the cross sectional view and a triangle shape in the plane view. It was found that there is amorphous MgO between each columnar, which occupies 8-25% in the MgO films. The electron energy loss spectroscopy (EELS) spectrum of amorphous MgO showed features of chemical states and electronic structures different from those of crystalline MgO. (C) 2009 Elsevier B.V. All rights reserved.
Keywords
SECONDARY-ELECTRON EMISSION; LAYER; SECONDARY-ELECTRON EMISSION; LAYER; PDP; Texture; EELS; Amorphous; Columnar structure
ISSN
0040-6090
URI
https://pubs.kist.re.kr/handle/201004/132475
DOI
10.1016/j.tsf.2009.01.167
Appears in Collections:
KIST Article > 2009
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