DSpace at KIST: 이차이온질량분석기(SIMS)를 이용한 표면분석

Full metadata record

DC Field	Value	Language
dc.contributor.author	이연희	-
dc.date.accessioned	2024-01-20T21:35:40Z	-
dc.date.available	2024-01-20T21:35:40Z	-
dc.date.created	2022-01-10	-
dc.date.issued	2009-03	-
dc.identifier.issn	1225-004X	-
dc.identifier.uri	https://pubs.kist.re.kr/handle/201004/132664	-
dc.publisher	대한화학회	-
dc.title	이차이온질량분석기(SIMS)를 이용한 표면분석	-
dc.type	Article	-
dc.description.journalClass	2	-
dc.identifier.bibliographicCitation	화학세계, v.49, no.3, pp.54 - 59	-
dc.citation.title	화학세계	-
dc.citation.volume	49	-
dc.citation.number	3	-
dc.citation.startPage	54	-
dc.citation.endPage	59	-
dc.subject.keywordAuthor	표면분석	-

Show Simple Item Record

KIST Library Institutional Repository