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dc.contributor.authorLee, Jihye-
dc.contributor.authorLee, Chiwoo-
dc.contributor.authorLee, Kangbong-
dc.contributor.authorLee, Yeonhee-
dc.date.accessioned2024-01-20T22:04:54Z-
dc.date.available2024-01-20T22:04:54Z-
dc.date.created2021-09-01-
dc.date.issued2008-12-15-
dc.identifier.issn0169-4332-
dc.identifier.urihttps://pubs.kist.re.kr/handle/201004/132880-
dc.description.abstractRed sealing-ink samples are frequently submitted to forensic laboratories for identification and comparison in a wide variety of criminal and civil cases. The non-destructive identification of sealing-inks on paper is of important to preserve as large an amount of a fraudulent check, forged document, or other such evidence as possible for use in legal proceedings. Time-of-flight secondary ion mass spectrometry (TOF-SIMS) for the analysis of red sealing-inks on paper surfaces was investigated. TOF-SIMS spectra were employed to identify elements and organic compounds in red sealing-inks. An analysis was performed on five sealing-inks of red color manufactured in Korea, Japan, and China. Several fibers from specific sealing-ink sample on paper can be removed leaving little evidence of tampering and can be distinguished from other sealing-inks. Overlapped area of sealing-ink and ballpoint pen in the document was also investigated in order to identify the sequence of recording. Therefore, this study shows that TOF-SIMS is a useful technique for the non-destructive analysis of red sealing-inks on paper. (C) 2008 Elsevier B.V. All rights reserved.-
dc.languageEnglish-
dc.publisherELSEVIER-
dc.titleTOF-SIMS study of red sealing-inks on paper and its forensic applications-
dc.typeArticle-
dc.identifier.doi10.1016/j.apsusc.2008.05.094-
dc.description.journalClass1-
dc.identifier.bibliographicCitationAPPLIED SURFACE SCIENCE, v.255, no.4, pp.1523 - 1526-
dc.citation.titleAPPLIED SURFACE SCIENCE-
dc.citation.volume255-
dc.citation.number4-
dc.citation.startPage1523-
dc.citation.endPage1526-
dc.description.journalRegisteredClassscie-
dc.description.journalRegisteredClassscopus-
dc.identifier.wosid000267217500083-
dc.identifier.scopusid2-s2.0-56449124740-
dc.relation.journalWebOfScienceCategoryChemistry, Physical-
dc.relation.journalWebOfScienceCategoryMaterials Science, Coatings & Films-
dc.relation.journalWebOfScienceCategoryPhysics, Applied-
dc.relation.journalWebOfScienceCategoryPhysics, Condensed Matter-
dc.relation.journalResearchAreaChemistry-
dc.relation.journalResearchAreaMaterials Science-
dc.relation.journalResearchAreaPhysics-
dc.type.docTypeArticle-
dc.subject.keywordAuthorSealing-inks-
dc.subject.keywordAuthorQuestioned document-
dc.subject.keywordAuthorForensic science-
dc.subject.keywordAuthorTOF-SIMS-
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KIST Article > 2008
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