Full metadata record
DC Field | Value | Language |
---|---|---|
dc.contributor.author | Lee, Jihye | - |
dc.contributor.author | Lee, Chiwoo | - |
dc.contributor.author | Lee, Kangbong | - |
dc.contributor.author | Lee, Yeonhee | - |
dc.date.accessioned | 2024-01-20T22:04:54Z | - |
dc.date.available | 2024-01-20T22:04:54Z | - |
dc.date.created | 2021-09-01 | - |
dc.date.issued | 2008-12-15 | - |
dc.identifier.issn | 0169-4332 | - |
dc.identifier.uri | https://pubs.kist.re.kr/handle/201004/132880 | - |
dc.description.abstract | Red sealing-ink samples are frequently submitted to forensic laboratories for identification and comparison in a wide variety of criminal and civil cases. The non-destructive identification of sealing-inks on paper is of important to preserve as large an amount of a fraudulent check, forged document, or other such evidence as possible for use in legal proceedings. Time-of-flight secondary ion mass spectrometry (TOF-SIMS) for the analysis of red sealing-inks on paper surfaces was investigated. TOF-SIMS spectra were employed to identify elements and organic compounds in red sealing-inks. An analysis was performed on five sealing-inks of red color manufactured in Korea, Japan, and China. Several fibers from specific sealing-ink sample on paper can be removed leaving little evidence of tampering and can be distinguished from other sealing-inks. Overlapped area of sealing-ink and ballpoint pen in the document was also investigated in order to identify the sequence of recording. Therefore, this study shows that TOF-SIMS is a useful technique for the non-destructive analysis of red sealing-inks on paper. (C) 2008 Elsevier B.V. All rights reserved. | - |
dc.language | English | - |
dc.publisher | ELSEVIER | - |
dc.title | TOF-SIMS study of red sealing-inks on paper and its forensic applications | - |
dc.type | Article | - |
dc.identifier.doi | 10.1016/j.apsusc.2008.05.094 | - |
dc.description.journalClass | 1 | - |
dc.identifier.bibliographicCitation | APPLIED SURFACE SCIENCE, v.255, no.4, pp.1523 - 1526 | - |
dc.citation.title | APPLIED SURFACE SCIENCE | - |
dc.citation.volume | 255 | - |
dc.citation.number | 4 | - |
dc.citation.startPage | 1523 | - |
dc.citation.endPage | 1526 | - |
dc.description.journalRegisteredClass | scie | - |
dc.description.journalRegisteredClass | scopus | - |
dc.identifier.wosid | 000267217500083 | - |
dc.identifier.scopusid | 2-s2.0-56449124740 | - |
dc.relation.journalWebOfScienceCategory | Chemistry, Physical | - |
dc.relation.journalWebOfScienceCategory | Materials Science, Coatings & Films | - |
dc.relation.journalWebOfScienceCategory | Physics, Applied | - |
dc.relation.journalWebOfScienceCategory | Physics, Condensed Matter | - |
dc.relation.journalResearchArea | Chemistry | - |
dc.relation.journalResearchArea | Materials Science | - |
dc.relation.journalResearchArea | Physics | - |
dc.type.docType | Article | - |
dc.subject.keywordAuthor | Sealing-inks | - |
dc.subject.keywordAuthor | Questioned document | - |
dc.subject.keywordAuthor | Forensic science | - |
dc.subject.keywordAuthor | TOF-SIMS | - |
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