Microstructural and optical analysis of superresolution phenomena due to Ge2Sb2Te5 thin films at blue light regime

Authors
Lee, Hyun SeokLee, Taek SungLee, YongwoonKim, JoohoLee, SuyounHuh, Joo-YoulKim, DonghwanCheong, Byung-ki
Issue Date
2008-12-01
Publisher
AMER INST PHYSICS
Citation
APPLIED PHYSICS LETTERS, v.93, no.22
Abstract
Superresolution (SR) phenomena due to Ge2Sb2Te5 films were examined by combined analysis of the transmission electron microscopy (TEM) microstructures of the laser-irradiated films and the results from dynamic and static tests using blue lasers. A new finding was made that comprises a complementary case of the classical SR readout by Ge2Sb2Te5 film; an amorphous band instead of a closed aperture of melt in the crystalline background forms behind a moving laser but still produces a high SR signal. A complete carrier-to-noise-ratio curve of a SR-read-only memory employing Ge2Sb2Te5 may be derived from a nonlinear optical effect, specifically thermally assisted saturable absorption.
Keywords
NEAR-FIELD STRUCTURE; DISK; RESOLUTION; MEMORY; NEAR-FIELD STRUCTURE; DISK; RESOLUTION; MEMORY; antimony alloys; germanium alloys; laser beam effects; optical saturation; tellurium alloys; thin films; transmission electron microscopy
ISSN
0003-6951
URI
https://pubs.kist.re.kr/handle/201004/132895
DOI
10.1063/1.3040695
Appears in Collections:
KIST Article > 2008
Files in This Item:
There are no files associated with this item.
Export
RIS (EndNote)
XLS (Excel)
XML

qrcode

Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.

BROWSE