Microstructural and optical analysis of superresolution phenomena due to Ge2Sb2Te5 thin films at blue light regime
- Authors
- Lee, Hyun Seok; Lee, Taek Sung; Lee, Yongwoon; Kim, Jooho; Lee, Suyoun; Huh, Joo-Youl; Kim, Donghwan; Cheong, Byung-ki
- Issue Date
- 2008-12-01
- Publisher
- AMER INST PHYSICS
- Citation
- APPLIED PHYSICS LETTERS, v.93, no.22
- Abstract
- Superresolution (SR) phenomena due to Ge2Sb2Te5 films were examined by combined analysis of the transmission electron microscopy (TEM) microstructures of the laser-irradiated films and the results from dynamic and static tests using blue lasers. A new finding was made that comprises a complementary case of the classical SR readout by Ge2Sb2Te5 film; an amorphous band instead of a closed aperture of melt in the crystalline background forms behind a moving laser but still produces a high SR signal. A complete carrier-to-noise-ratio curve of a SR-read-only memory employing Ge2Sb2Te5 may be derived from a nonlinear optical effect, specifically thermally assisted saturable absorption.
- Keywords
- NEAR-FIELD STRUCTURE; DISK; RESOLUTION; MEMORY; NEAR-FIELD STRUCTURE; DISK; RESOLUTION; MEMORY; antimony alloys; germanium alloys; laser beam effects; optical saturation; tellurium alloys; thin films; transmission electron microscopy
- ISSN
- 0003-6951
- URI
- https://pubs.kist.re.kr/handle/201004/132895
- DOI
- 10.1063/1.3040695
- Appears in Collections:
- KIST Article > 2008
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