Performance improvement of organic thin-film transistors by electrode/pentacene interface treatment using a hydrogen plasma

Authors
Lee, Joo-WonChang, Jea-WonKim, Dong-JooYoon, Young-SooKim, Jai-Kyeong
Issue Date
2007-05
Publisher
IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
Citation
IEEE ELECTRON DEVICE LETTERS, v.28, no.5, pp.379 - 382
Abstract
Pentacene-based organic thin-film transistors (TFTs) have been fabricated with and without treatment by hydrogen (H-2) plasma at the interface between the electrode and the pentacene surface. Processing with a H-2 plasma was carried out in a plasma-enhanced chemical vapor deposition with varying treatment times. The interface treatment by H-2 plasma resulted in improved device electrical properties. Removal of oxygen from the pentacene surface occurs due to slight etching by the plasma. Sufficient flux density Of the H-2 plasma leads to full pentacene-surface coverage by rearranging the hydrogen with carbon instead of oxygen. Atomic force microscopy profiles reveal the morphology changes of the pentacene surface after treatment, and secondary ion mass spectrometry shows the change via compositional depth profiles indicating H-2, O-2, and C-H binding. Hydrogen treatment, therefore, appears to modify the interface by removing the surface oxygen layer, resulting in better performance of the organic TFT.
Keywords
H-2 plasma; interface; mobility; organic thin film transistor (OTFT); secondary ion mass spectrometry (SIMS); surface treatment
ISSN
0741-3106
URI
https://pubs.kist.re.kr/handle/201004/134423
DOI
10.1109/LED.2007.895382
Appears in Collections:
KIST Article > 2007
Files in This Item:
There are no files associated with this item.
Export
RIS (EndNote)
XLS (Excel)
XML

qrcode

Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.

BROWSE