Full metadata record
DC Field | Value | Language |
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dc.contributor.author | Kim, Jeong-Ryeol | - |
dc.contributor.author | Kim, Dong-Wan | - |
dc.contributor.author | Yoon, Sung Hun | - |
dc.contributor.author | Hong, Kug Sun | - |
dc.date.accessioned | 2024-01-21T02:01:52Z | - |
dc.date.available | 2024-01-21T02:01:52Z | - |
dc.date.created | 2021-09-01 | - |
dc.date.issued | 2006-12 | - |
dc.identifier.issn | 1385-3449 | - |
dc.identifier.uri | https://pubs.kist.re.kr/handle/201004/134887 | - |
dc.description.abstract | The low sintering temperature and the good dielectric properties such as high dielectric constant (epsilon(r) ), high quality factor (Q x f), and small temperature coefficient of resonant frequency (TCF) are required for the application of chip passive components in wireless communication low temperature co-fired ceramics (LTCC). In the present study, the sintering behaviors and dielectric properties of Ba3Ti5Nb6O28 ceramics were investigated as a function of B2O3-CuO content. The pure Ba3Ti5Nb6O28 system showed a high sintering temperature (1250 degrees C) and had the good microwave dielectric properties: Q x f of 10,600 GHz, epsilon(r) of 37, TCF of -12 ppm/degrees C. The addition of B2O3-CuO was revealed to lower the sintering temperature of Ba3Ti5Nb6O28, 900 degrees C and to enhance the microwave dielectric properties: Q x f of 32,500 GHz, epsilon(r) of 40, TCF of 9 ppm/degrees C. From the X-ray photoelectron spectroscopy (XPS) and X-ray powder diffraction (XRD) studies, these phenomena were explained in terms of the reduction of oxygen vacancies and the formation of secondary phases having the good microwave dielectric properties. | - |
dc.language | English | - |
dc.publisher | SPRINGER | - |
dc.subject | CERAMICS | - |
dc.subject | BA2TI9O20 | - |
dc.subject | SYSTEM | - |
dc.subject | OXIDE | - |
dc.title | Low temperature sintering and microwave dielectric properties of Ba3Ti5Nb6O28 with B2O3 and CuO additions | - |
dc.type | Article | - |
dc.identifier.doi | 10.1007/s10832-006-0453-5 | - |
dc.description.journalClass | 1 | - |
dc.identifier.bibliographicCitation | JOURNAL OF ELECTROCERAMICS, v.17, no.2-4, pp.439 - 443 | - |
dc.citation.title | JOURNAL OF ELECTROCERAMICS | - |
dc.citation.volume | 17 | - |
dc.citation.number | 2-4 | - |
dc.citation.startPage | 439 | - |
dc.citation.endPage | 443 | - |
dc.description.journalRegisteredClass | scie | - |
dc.description.journalRegisteredClass | scopus | - |
dc.identifier.wosid | 000243610600060 | - |
dc.identifier.scopusid | 2-s2.0-33847229882 | - |
dc.relation.journalWebOfScienceCategory | Materials Science, Ceramics | - |
dc.relation.journalResearchArea | Materials Science | - |
dc.type.docType | Article; Proceedings Paper | - |
dc.subject.keywordPlus | CERAMICS | - |
dc.subject.keywordPlus | BA2TI9O20 | - |
dc.subject.keywordPlus | SYSTEM | - |
dc.subject.keywordPlus | OXIDE | - |
dc.subject.keywordAuthor | low temperature sintering | - |
dc.subject.keywordAuthor | Ba3Ti5Nb6O28 | - |
dc.subject.keywordAuthor | XPS | - |
dc.subject.keywordAuthor | dielectric properties | - |
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