DSpace at KIST: Effect of Thermal Stress on the Microwave Dielectric Properties of (300-x) nm MgTiO3/(x) nm CaTiO3 Thin Films

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DC Field	Value	Language
dc.contributor.author	윤기현	-
dc.contributor.author	최지원	-
dc.date.accessioned	2024-01-21T02:05:38Z	-
dc.date.available	2024-01-21T02:05:38Z	-
dc.date.created	2022-01-10	-
dc.date.issued	2006-10	-
dc.identifier.issn	1661-819X	-
dc.identifier.uri	https://pubs.kist.re.kr/handle/201004/135042	-
dc.title	Effect of Thermal Stress on the Microwave Dielectric Properties of (300-x) nm MgTiO3/(x) nm CaTiO3 Thin Films	-
dc.type	Article	-
dc.description.journalClass	3	-
dc.identifier.bibliographicCitation	Advances in Science and Technology, v.45, pp.2332 - 2336	-
dc.citation.title	Advances in Science and Technology	-
dc.citation.volume	45	-
dc.citation.startPage	2332	-
dc.citation.endPage	2336	-
dc.subject.keywordAuthor	Thermal stress	-
dc.subject.keywordAuthor	Microwave dielectrics	-
dc.subject.keywordAuthor	Dielectric loss	-
dc.subject.keywordAuthor	Dielectric layer	-

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