Full metadata record
DC Field | Value | Language |
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dc.contributor.author | Ha, JY | - |
dc.contributor.author | Choi, JW | - |
dc.contributor.author | Kang, CY | - |
dc.contributor.author | Yoon, SJ | - |
dc.contributor.author | Cho, DJ | - |
dc.contributor.author | Kim, HJ | - |
dc.date.accessioned | 2024-01-21T05:32:17Z | - |
dc.date.available | 2024-01-21T05:32:17Z | - |
dc.date.created | 2021-09-03 | - |
dc.date.issued | 2005-03 | - |
dc.identifier.issn | 0021-4922 | - |
dc.identifier.uri | https://pubs.kist.re.kr/handle/201004/136716 | - |
dc.description.abstract | The microstructures. and the microwave dielectric properties of Ca[(Li1/3Nb2/3)(1-x)Ti-x]O3-delta (CLNT) ceramics with different amount of glass frit additions were investigated. Addition of glass frit(B2O3-ZnO-SiO2-PbO system) improved the densification and decreased the sintering temperature from 1150 degrees C to 900 degrees C of Ca[(Li1/3Nb2/3)(1-x)Ti-x]O3-delta microwave dielectric ceramics. The dielectric constants (epsilon(r)) and bulk density were increased, as increasing glass contents from 10 wt% to 15 wt%. The quality factor (Q (.) f(0)), however, was decreased slightly. The temperature coefficients of the resonant frequency (tau(f)) shifted positive value as glass contents were increased. The dielectric proper-ties of Ca[(Li1/3Nb2/3)(0.8)Ti-0.2]O3-delta with 12 wt% glass sintered at 900 degrees C for 3 h were epsilon(r) = 40, Q (.) f(0) = 12, 500, tau(f) = -8ppm/degrees C, respectively. The relationship between the microstructure and dielectric properties of ceramics was studied by X-ray diffraction (XRD), energy dispersive spectroscopy (EDS) and scanning electron microscopy (SEM). | - |
dc.language | English | - |
dc.publisher | JAPAN SOC APPLIED PHYSICS | - |
dc.subject | (ZR,SN)TIO4 | - |
dc.subject | ADDITIONS | - |
dc.subject | TI | - |
dc.title | Low temperature sintering of Ca[(Li1/3Nb2/3)(1-x)Ti-x]O3-delta based microwave dielectric ceramics with glass frit | - |
dc.type | Article | - |
dc.identifier.doi | 10.1143/JJAP.44.1322 | - |
dc.description.journalClass | 1 | - |
dc.identifier.bibliographicCitation | JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS BRIEF COMMUNICATIONS & REVIEW PAPERS, v.44, no.3, pp.1322 - 1325 | - |
dc.citation.title | JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS BRIEF COMMUNICATIONS & REVIEW PAPERS | - |
dc.citation.volume | 44 | - |
dc.citation.number | 3 | - |
dc.citation.startPage | 1322 | - |
dc.citation.endPage | 1325 | - |
dc.description.journalRegisteredClass | scie | - |
dc.description.journalRegisteredClass | scopus | - |
dc.identifier.wosid | 000228307400035 | - |
dc.identifier.scopusid | 2-s2.0-19944404482 | - |
dc.relation.journalWebOfScienceCategory | Physics, Applied | - |
dc.relation.journalResearchArea | Physics | - |
dc.type.docType | Article | - |
dc.subject.keywordPlus | (ZR,SN)TIO4 | - |
dc.subject.keywordPlus | ADDITIONS | - |
dc.subject.keywordPlus | TI | - |
dc.subject.keywordAuthor | microwave | - |
dc.subject.keywordAuthor | dielectric | - |
dc.subject.keywordAuthor | LTCC | - |
dc.subject.keywordAuthor | addition of glass | - |
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