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dc.contributor.authorHa, JY-
dc.contributor.authorChoi, JW-
dc.contributor.authorKang, CY-
dc.contributor.authorYoon, SJ-
dc.contributor.authorCho, DJ-
dc.contributor.authorKim, HJ-
dc.date.accessioned2024-01-21T05:32:17Z-
dc.date.available2024-01-21T05:32:17Z-
dc.date.created2021-09-03-
dc.date.issued2005-03-
dc.identifier.issn0021-4922-
dc.identifier.urihttps://pubs.kist.re.kr/handle/201004/136716-
dc.description.abstractThe microstructures. and the microwave dielectric properties of Ca[(Li1/3Nb2/3)(1-x)Ti-x]O3-delta (CLNT) ceramics with different amount of glass frit additions were investigated. Addition of glass frit(B2O3-ZnO-SiO2-PbO system) improved the densification and decreased the sintering temperature from 1150 degrees C to 900 degrees C of Ca[(Li1/3Nb2/3)(1-x)Ti-x]O3-delta microwave dielectric ceramics. The dielectric constants (epsilon(r)) and bulk density were increased, as increasing glass contents from 10 wt% to 15 wt%. The quality factor (Q (.) f(0)), however, was decreased slightly. The temperature coefficients of the resonant frequency (tau(f)) shifted positive value as glass contents were increased. The dielectric proper-ties of Ca[(Li1/3Nb2/3)(0.8)Ti-0.2]O3-delta with 12 wt% glass sintered at 900 degrees C for 3 h were epsilon(r) = 40, Q (.) f(0) = 12, 500, tau(f) = -8ppm/degrees C, respectively. The relationship between the microstructure and dielectric properties of ceramics was studied by X-ray diffraction (XRD), energy dispersive spectroscopy (EDS) and scanning electron microscopy (SEM).-
dc.languageEnglish-
dc.publisherJAPAN SOC APPLIED PHYSICS-
dc.subject(ZR,SN)TIO4-
dc.subjectADDITIONS-
dc.subjectTI-
dc.titleLow temperature sintering of Ca[(Li1/3Nb2/3)(1-x)Ti-x]O3-delta based microwave dielectric ceramics with glass frit-
dc.typeArticle-
dc.identifier.doi10.1143/JJAP.44.1322-
dc.description.journalClass1-
dc.identifier.bibliographicCitationJAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS BRIEF COMMUNICATIONS & REVIEW PAPERS, v.44, no.3, pp.1322 - 1325-
dc.citation.titleJAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS BRIEF COMMUNICATIONS & REVIEW PAPERS-
dc.citation.volume44-
dc.citation.number3-
dc.citation.startPage1322-
dc.citation.endPage1325-
dc.description.journalRegisteredClassscie-
dc.description.journalRegisteredClassscopus-
dc.identifier.wosid000228307400035-
dc.identifier.scopusid2-s2.0-19944404482-
dc.relation.journalWebOfScienceCategoryPhysics, Applied-
dc.relation.journalResearchAreaPhysics-
dc.type.docTypeArticle-
dc.subject.keywordPlus(ZR,SN)TIO4-
dc.subject.keywordPlusADDITIONS-
dc.subject.keywordPlusTI-
dc.subject.keywordAuthormicrowave-
dc.subject.keywordAuthordielectric-
dc.subject.keywordAuthorLTCC-
dc.subject.keywordAuthoraddition of glass-
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