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dc.contributor.authorPark, JW-
dc.contributor.authorPark, Y-
dc.contributor.authorPark, JW-
dc.contributor.authorJeon, M-
dc.contributor.authorLee, JK-
dc.date.accessioned2024-01-21T05:41:49Z-
dc.date.available2024-01-21T05:41:49Z-
dc.date.created2021-09-04-
dc.date.issued2005-01-
dc.identifier.issn0734-2101-
dc.identifier.urihttps://pubs.kist.re.kr/handle/201004/136890-
dc.description.abstractHeteroepitaxial ZnO thin film was deposited on a sapphire (001) substrate using off-axis radio-frequency magnetron sputtering. The crystallinity of the ZnO thin film was affected by deposition pressure, substrate temperature, and postannealing temperature. The low-temperature photoluminescence of heteroepitaxial ZnO thin film grown under optimum conditions of 650 degreesC. 120 W, and 10 mTorr showed strong UV emission at 3.36 eV with a full width at half maximum (FWHM) of 16.0 meV. After annealing in an O-2 ambient at 950 degreesC, the high-resolution x-ray diffraction rocking curve FWHM of the ZnO thin film markedly decreased from 0.38degrees to 0.19degrees although UV emission decreased. These results indicated that a heteroepitaxial ZnO thin film with strong UV emission can be grown by off-axis rf sputtering and that O-2 annealing helps enhance the crystallinity of ZnO thin film which can be used as a buffer layer in ZnO/(Mg,Zn)O multiple quantum well structures. To demonstrate an application of the ZnO thin film, a ZnO/(Mg,Zn)O nanomultilayer was grown on a ZnO-buffered sapphire substrate and its optical properties were measured. (C) 2005 American Vacuum Society.-
dc.languageEnglish-
dc.publisherA V S AMER INST PHYSICS-
dc.subjectZINC-OXIDE FILMS-
dc.subjectROOM-TEMPERATURE-
dc.subjectSUPERLATTICES-
dc.subjectENHANCEMENT-
dc.subjectSAPPHIRE-
dc.subjectEXCITONS-
dc.subjectWELLS-
dc.titleGrowth of heteroepitaxial ZnO thin film and ZnO/(Mg,Zn)O nanomultilayer by off-axis rf magnetron sputtering-
dc.typeArticle-
dc.identifier.doi10.1116/1.1814105-
dc.description.journalClass1-
dc.identifier.bibliographicCitationJOURNAL OF VACUUM SCIENCE & TECHNOLOGY A, v.23, no.1, pp.1 - 4-
dc.citation.titleJOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-
dc.citation.volume23-
dc.citation.number1-
dc.citation.startPage1-
dc.citation.endPage4-
dc.description.journalRegisteredClassscie-
dc.description.journalRegisteredClassscopus-
dc.identifier.wosid000226558900001-
dc.identifier.scopusid2-s2.0-31144461624-
dc.relation.journalWebOfScienceCategoryMaterials Science, Coatings & Films-
dc.relation.journalWebOfScienceCategoryPhysics, Applied-
dc.relation.journalResearchAreaMaterials Science-
dc.relation.journalResearchAreaPhysics-
dc.type.docTypeArticle-
dc.subject.keywordPlusZINC-OXIDE FILMS-
dc.subject.keywordPlusROOM-TEMPERATURE-
dc.subject.keywordPlusSUPERLATTICES-
dc.subject.keywordPlusENHANCEMENT-
dc.subject.keywordPlusSAPPHIRE-
dc.subject.keywordPlusEXCITONS-
dc.subject.keywordPlusWELLS-
dc.subject.keywordAuthorZnO-
dc.subject.keywordAuthorO2 annealing-
dc.subject.keywordAuthorHeteroepitaxy-
dc.subject.keywordAuthorOff axis sputtering-
dc.subject.keywordAuthorPhotoluminescence-
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KIST Article > 2005
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