Full metadata record

DC Field Value Language
dc.contributor.authorChoi, HJ-
dc.contributor.authorKim, YW-
dc.date.accessioned2024-01-21T06:03:04Z-
dc.date.available2024-01-21T06:03:04Z-
dc.date.created2021-09-05-
dc.date.issued2004-12-
dc.identifier.issn0955-2219-
dc.identifier.urihttps://pubs.kist.re.kr/handle/201004/136997-
dc.description.abstractThe intergranular film of self-reinforced SiC ceramics prepared by hot pressing and further annealing with SiO2-Y2O3 and SiO2-Al2O3 as sintering additives was observed by high-resolution transmission electron microscopy. The film thickness of SiC ceramics with SiO2-Y2O3 was similar to1.2 nm whereas that of ceramics with SiO2-Al2O3 was similar to0.8 nm. Based on the refined continuum model, an explanation on the variation of thickness with sintering additives is given. It seems that the behavior of intergranular glassy film of SiC ceramics is akin to that Of Si3N4 ceramics. (C) 2004 Elsevier Ltd. All rights reserved.-
dc.languageEnglish-
dc.publisherELSEVIER SCI LTD-
dc.subjectTRANSMISSION ELECTRON-MICROSCOPY-
dc.subjectNITRIDE CERAMICS-
dc.subjectALUMINUM NITRIDE-
dc.subjectMICROSTRUCTURE-
dc.subjectPHASES-
dc.subjectCHEMISTRY-
dc.subjectBEHAVIOR-
dc.subjectOXIDE-
dc.subjectSI3N4-
dc.titleIntergranular film thickness of self-reinforced silicon carbide ceramics-
dc.typeArticle-
dc.identifier.doi10.1016/j.jeurceramsoc.2003.12.029-
dc.description.journalClass1-
dc.identifier.bibliographicCitationJOURNAL OF THE EUROPEAN CERAMIC SOCIETY, v.24, no.15-16, pp.3795 - 3800-
dc.citation.titleJOURNAL OF THE EUROPEAN CERAMIC SOCIETY-
dc.citation.volume24-
dc.citation.number15-16-
dc.citation.startPage3795-
dc.citation.endPage3800-
dc.description.journalRegisteredClassscie-
dc.description.journalRegisteredClassscopus-
dc.identifier.wosid000224259400014-
dc.identifier.scopusid2-s2.0-11144259544-
dc.relation.journalWebOfScienceCategoryMaterials Science, Ceramics-
dc.relation.journalResearchAreaMaterials Science-
dc.type.docTypeArticle-
dc.subject.keywordPlusTRANSMISSION ELECTRON-MICROSCOPY-
dc.subject.keywordPlusNITRIDE CERAMICS-
dc.subject.keywordPlusALUMINUM NITRIDE-
dc.subject.keywordPlusMICROSTRUCTURE-
dc.subject.keywordPlusPHASES-
dc.subject.keywordPlusCHEMISTRY-
dc.subject.keywordPlusBEHAVIOR-
dc.subject.keywordPlusOXIDE-
dc.subject.keywordPlusSI3N4-
dc.subject.keywordAuthorSiC-
dc.subject.keywordAuthorliquid phase sintering-
dc.subject.keywordAuthorelectron microscopy-
dc.subject.keywordAuthorgrain boundaries-
dc.subject.keywordAuthorinterphase-
Appears in Collections:
KIST Article > 2004
Files in This Item:
There are no files associated with this item.
Export
RIS (EndNote)
XLS (Excel)
XML

qrcode

Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.

BROWSE