Full metadata record
DC Field | Value | Language |
---|---|---|
dc.contributor.author | 정태웅 | - |
dc.contributor.author | 이기영 | - |
dc.contributor.author | 김남수 | - |
dc.contributor.author | 오정근 | - |
dc.contributor.author | 주병권 | - |
dc.date.accessioned | 2024-01-21T06:12:35Z | - |
dc.date.available | 2024-01-21T06:12:35Z | - |
dc.date.created | 2021-09-06 | - |
dc.date.issued | 2004-10 | - |
dc.identifier.issn | 1226-7945 | - |
dc.identifier.uri | https://pubs.kist.re.kr/handle/201004/137172 | - |
dc.description.abstract | The latch-up current and switching characteristics of MOS-Controlled Thyristor(MCT) are studied with variation of the channel length and impurity concentration. The proposed MCT power device has the lateral structure and P-epitaxial layer in substrate. Two dimensional MEDICI simulator is used to study the latch-up current and forward voltage-drop from the characteristics of I-V and the switching characteristics with variation of impurity concentration. The channel length and impurity concentration of the proposed MCT power device show the strong affect on the anode current and turn-off time. The increase of impurity concentration in P and N channels is found to give the increase of latch-up current and forward voltage-drop. | - |
dc.publisher | 한국전기전자재료학회 | - |
dc.title | 수평 구조의 MOS-controlled Thyristor에서 채널 길이 및 불순물 농도에 의한 Anode 전류 특성 | - |
dc.title.alternative | Characteristics of Anode Current due to the Impurity Concentration and the Channel Length of Lateral MOS-controlled Thyristor | - |
dc.type | Article | - |
dc.description.journalClass | 2 | - |
dc.identifier.bibliographicCitation | 전기전자재료학회논문지, v.17, no.10, pp.1034 - 1040 | - |
dc.citation.title | 전기전자재료학회논문지 | - |
dc.citation.volume | 17 | - |
dc.citation.number | 10 | - |
dc.citation.startPage | 1034 | - |
dc.citation.endPage | 1040 | - |
dc.description.journalRegisteredClass | kci | - |
dc.identifier.kciid | ART000937162 | - |
dc.subject.keywordAuthor | MCT | - |
dc.subject.keywordAuthor | Channel length | - |
dc.subject.keywordAuthor | Impurity concentration | - |
dc.subject.keywordAuthor | Latch-up current | - |
dc.subject.keywordAuthor | Forward voltage-drop | - |
dc.subject.keywordAuthor | MCT | - |
dc.subject.keywordAuthor | Channel length | - |
dc.subject.keywordAuthor | Impurity concentration | - |
dc.subject.keywordAuthor | Latch-up current | - |
dc.subject.keywordAuthor | Forward voltage-drop | - |
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