DSpace at KISTKIST Article2004

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dc.contributor.author아르빈드 싱-
dc.contributor.author윤의성-
dc.contributor.author오현진-
dc.contributor.author공호성-
dc.date.accessioned2024-01-21T07:01:10Z-
dc.date.available2024-01-21T07:01:10Z-
dc.date.created2022-01-10-
dc.date.issued2004-06-
dc.identifier.issn1229-9189-
dc.identifier.urihttps://pubs.kist.re.kr/handle/201004/137499-
dc.titleNano-scale adhesion and friction on Si wafer with the tip size using AFM-
dc.typeArticle-
dc.description.journalClass3-
dc.identifier.bibliographicCitationKSTLE International Journal, v.5, no.1, pp.1 - 6-
dc.citation.titleKSTLE International Journal-
dc.citation.volume5-
dc.citation.number1-
dc.citation.startPage1-
dc.citation.endPage6-
dc.subject.keywordAuthornano-
dc.subject.keywordAuthoradhesion-
dc.subject.keywordAuthorfriction-
dc.subject.keywordAuthortribology-
dc.subject.keywordAuthorAFM-
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KIST Article > 2004
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