Full metadata record
DC Field | Value | Language |
---|---|---|
dc.contributor.author | 안효석 | - |
dc.contributor.author | S.A. Chizhik | - |
dc.contributor.author | A. M. Dubravin | - |
dc.date.accessioned | 2024-01-21T13:11:10Z | - |
dc.date.available | 2024-01-21T13:11:10Z | - |
dc.date.created | 2022-01-10 | - |
dc.date.issued | 2000-11 | - |
dc.identifier.uri | https://pubs.kist.re.kr/handle/201004/140943 | - |
dc.title | Atomic force microscopy of hard materials in the phase imaging mode | - |
dc.type | Article | - |
dc.description.journalClass | 3 | - |
dc.identifier.bibliographicCitation | Surface Investigation, v.11, pp.51 - 55 | - |
dc.citation.title | Surface Investigation | - |
dc.citation.volume | 11 | - |
dc.citation.startPage | 51 | - |
dc.citation.endPage | 55 | - |
dc.subject.keywordAuthor | AFM (Atomic Force Microscopy) | - |
dc.subject.keywordAuthor | phase contrast image | - |
dc.subject.keywordAuthor | tapping mode | - |
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