Full metadata record
DC Field | Value | Language |
---|---|---|
dc.contributor.author | Lee, DJ | - |
dc.contributor.author | Lee, NY | - |
dc.contributor.author | Jung, SJ | - |
dc.contributor.author | Kim, KS | - |
dc.contributor.author | Lee, YH | - |
dc.contributor.author | Jang, J | - |
dc.contributor.author | Ju, BK | - |
dc.date.accessioned | 2024-01-21T14:04:06Z | - |
dc.date.available | 2024-01-21T14:04:06Z | - |
dc.date.created | 2021-09-04 | - |
dc.date.issued | 2000-06 | - |
dc.identifier.issn | 0013-4651 | - |
dc.identifier.uri | https://pubs.kist.re.kr/handle/201004/141367 | - |
dc.description.abstract | A tubeless packaging technology for field emission display (FED) devices is developed using indirect glass-to-glass electrostatic bonding with an intermediate amorphous silicon layer at a low temperature of 230 degrees C. The glass-to-glass bonding mechanism is investigated by secondary-ion mass spectroscopy. To evaluate the vacuum sealing capability of a FED panel packaged by this method, the leak characteristics of the vacuum were examined by spinning rotor gauge for 6 months and the electron emission properties of the panel was measured continuously for different amounts of time over a 26 day period. In order to examine the effect of the removal of the exhausting tube on the enhancement of vacuum efficiency, we have calculated a theoretical vacuum level in the panel based on conductance and throughput and compared with experimental values. (C) 2000 The Electrochemical Society. S0013-4651(99)09-091-6. All rights reserved. | - |
dc.language | English | - |
dc.publisher | ELECTROCHEMICAL SOC INC | - |
dc.subject | GLASS | - |
dc.title | Application of electrostatic bonding to field emission display vacuum packaging | - |
dc.type | Article | - |
dc.identifier.doi | 10.1149/1.1393541 | - |
dc.description.journalClass | 1 | - |
dc.identifier.bibliographicCitation | JOURNAL OF THE ELECTROCHEMICAL SOCIETY, v.147, no.6, pp.2385 - 2388 | - |
dc.citation.title | JOURNAL OF THE ELECTROCHEMICAL SOCIETY | - |
dc.citation.volume | 147 | - |
dc.citation.number | 6 | - |
dc.citation.startPage | 2385 | - |
dc.citation.endPage | 2388 | - |
dc.description.journalRegisteredClass | scie | - |
dc.description.journalRegisteredClass | scopus | - |
dc.identifier.wosid | 000087561800065 | - |
dc.identifier.scopusid | 2-s2.0-0034207098 | - |
dc.relation.journalWebOfScienceCategory | Electrochemistry | - |
dc.relation.journalWebOfScienceCategory | Materials Science, Coatings & Films | - |
dc.relation.journalResearchArea | Electrochemistry | - |
dc.relation.journalResearchArea | Materials Science | - |
dc.type.docType | Article | - |
dc.subject.keywordPlus | GLASS | - |
dc.subject.keywordAuthor | FED | - |
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