DSpace at KISTKIST Article2000

Full metadata record

DC Field Value Language
dc.contributor.authorCho, WS-
dc.contributor.authorKim, JY-
dc.contributor.authorPark, NG-
dc.contributor.authorLyo, IW-
dc.contributor.authorJeong, K-
dc.contributor.authorKim, SS-
dc.contributor.authorChoi, DS-
dc.contributor.authorWhang, CN-
dc.contributor.authorChae, KH-
dc.date.accessioned2024-01-21T14:05:02Z-
dc.date.available2024-01-21T14:05:02Z-
dc.date.created2021-09-01-
dc.date.issued2000-05-10-
dc.identifier.issn0039-6028-
dc.identifier.urihttps://pubs.kist.re.kr/handle/201004/141383-
dc.description.abstractThe atomic structure of Co on the Si(001)(2 x 1) surface is investigated by coaxial impact collision ion scattering spectroscopy. When 0.6 ML Co atoms are deposited on the Si(001) at room temperature, the deposited Co atoms reside two-dimensionally on the Si(001) surface. The first preferential adsorption site is T4, and the next favorable site is HB, with a height of 2.72 Angstrom and 3.47 Angstrom from the second Si(001) layer, respectively. As the coverage increases up to 1.9 ML, Co atoms occupy the HE and T3 sites, of which the latter is at a height of 3.58 Angstrom from the second layer of the Si(001) surface. (C) 2000 Elsevier Science B.V. All rights reserved.-
dc.languageEnglish-
dc.publisherELSEVIER SCIENCE BV-
dc.subjectSCANNING-TUNNELING-MICROSCOPY-
dc.subjectSCATTERING SPECTROSCOPY ISS-
dc.subjectION-SCATTERING-
dc.subjectSURFACE-
dc.subjectGROWTH-
dc.subjectSI(100)-
dc.subjectCOSI2-
dc.titleAtomic structure of ultrathin Co layer on Si(001)(2 x 1) at room temperature-
dc.typeArticle-
dc.identifier.doi10.1016/S0039-6028(00)00344-7-
dc.description.journalClass1-
dc.identifier.bibliographicCitationSURFACE SCIENCE, v.453, no.1-3, pp.L309 - L314-
dc.citation.titleSURFACE SCIENCE-
dc.citation.volume453-
dc.citation.number1-3-
dc.citation.startPageL309-
dc.citation.endPageL314-
dc.description.journalRegisteredClassscie-
dc.description.journalRegisteredClassscopus-
dc.identifier.wosid000087302400003-
dc.relation.journalWebOfScienceCategoryChemistry, Physical-
dc.relation.journalWebOfScienceCategoryPhysics, Condensed Matter-
dc.relation.journalResearchAreaChemistry-
dc.relation.journalResearchAreaPhysics-
dc.type.docTypeLetter-
dc.subject.keywordPlusSCANNING-TUNNELING-MICROSCOPY-
dc.subject.keywordPlusSCATTERING SPECTROSCOPY ISS-
dc.subject.keywordPlusION-SCATTERING-
dc.subject.keywordPlusSURFACE-
dc.subject.keywordPlusGROWTH-
dc.subject.keywordPlusSI(100)-
dc.subject.keywordPlusCOSI2-
dc.subject.keywordAuthorcobalt-
dc.subject.keywordAuthorlow energy ion scattering (LEIS)-
dc.subject.keywordAuthorsilicon-
dc.subject.keywordAuthorsurface structure, morphology, roughness, and topography-
Appears in Collections:
KIST Article > 2000
Files in This Item:
There are no files associated with this item.
Export
RIS (EndNote)
XLS (Excel)
XML
Show Simple Item Record

qrcode

Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.

BROWSE