Full metadata record
DC Field | Value | Language |
---|---|---|
dc.contributor.author | Seo, Changwon | - |
dc.contributor.author | Shim, Jae -Eon | - |
dc.contributor.author | Kim, Chanseul | - |
dc.contributor.author | Lee, Eunji | - |
dc.contributor.author | Choi, Gwan Hyun | - |
dc.contributor.author | Yoo, Pil Jin | - |
dc.contributor.author | Yi, Gi-Ra | - |
dc.contributor.author | Kim, Jeongyong | - |
dc.contributor.author | Kim, Teun-Teun | - |
dc.date.accessioned | 2024-07-18T04:30:07Z | - |
dc.date.available | 2024-07-18T04:30:07Z | - |
dc.date.created | 2024-07-18 | - |
dc.date.issued | 2024-09 | - |
dc.identifier.issn | 1567-1739 | - |
dc.identifier.uri | https://pubs.kist.re.kr/handle/201004/150241 | - |
dc.description.abstract | In this article, we introduce our custom-built back -focal plane (BFP) scanning spectroscopy to explore an angle -resolved optical dispersion in two-dimensional (2D) photonic crystal (PhC) constructed with hexagonal lattice of nano -scaled dielectric rods. We fabricated a uniformly large -area photonic crystal measuring 1 cm by 0.5 cm, featuring a polymer -based hexagonal lattice on a gold layer, using capillary force lithography. This precision enables the effective confinement of photonic modes, leading to enhanced optical interactions. We successfully map out the angle -resolved reflectance spectra by directly scanning BFP, revealing the structure 's angle dependent optical response and providing insights into its iso-frequency contours. Our approach simplifies the exploration of advanced optical materials, highlighting the role of precise fabrication and measurement techniques in understanding and utilizing the optical properties of structured materials for various technological applications. | - |
dc.language | English | - |
dc.publisher | The Korean Physical Society | - |
dc.title | Back-focal plane scanning spectroscopy for investigating the optical dispersion of large-area two-dimensional photonic crystal fabricated by capillary force lithography | - |
dc.type | Article | - |
dc.identifier.doi | 10.1016/j.cap.2024.06.001 | - |
dc.description.journalClass | 1 | - |
dc.identifier.bibliographicCitation | Current Applied Physics, v.65, pp.47 - 52 | - |
dc.citation.title | Current Applied Physics | - |
dc.citation.volume | 65 | - |
dc.citation.startPage | 47 | - |
dc.citation.endPage | 52 | - |
dc.description.isOpenAccess | N | - |
dc.description.journalRegisteredClass | scie | - |
dc.description.journalRegisteredClass | scopus | - |
dc.description.journalRegisteredClass | kci | - |
dc.identifier.wosid | 001261115500001 | - |
dc.identifier.scopusid | 2-s2.0-85195562714 | - |
dc.relation.journalWebOfScienceCategory | Materials Science, Multidisciplinary | - |
dc.relation.journalWebOfScienceCategory | Physics, Applied | - |
dc.relation.journalResearchArea | Materials Science | - |
dc.relation.journalResearchArea | Physics | - |
dc.type.docType | Article | - |
dc.subject.keywordPlus | BAND-STRUCTURE | - |
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