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dc.contributor.authorChoi, Haneul-
dc.contributor.authorKeun Won Lee-
dc.contributor.authorBAEK, SEUNG HYUB-
dc.contributor.authorKi Sub Cho-
dc.contributor.authorChang, Hye Jung-
dc.date.accessioned2025-11-06T10:34:25Z-
dc.date.available2025-11-06T10:34:25Z-
dc.date.created2025-11-04-
dc.date.issued2025-05-29-
dc.identifier.urihttps://pubs.kist.re.kr/handle/201004/153423-
dc.publisher한국현미경학회-
dc.titleQuantification of the Crystal Fraction and Domain Orientation of Y-doped HfO2 Epitaxial Thin Film using Deep Learning-based Atomic Image Analysis-
dc.typeConference-
dc.description.journalClass2-
dc.identifier.bibliographicCitation2025 현미경학회 춘계학술대회-
dc.citation.title2025 현미경학회 춘계학술대회-
dc.citation.conferencePlaceKO-
dc.citation.conferencePlace서울 연세대학교 백양누리 국제회의실-
dc.citation.conferenceDate2025-05-28-
dc.relation.isPartOf2025 현미경학회 춘계학술대회-

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