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dc.contributor.authorPark, Changhoon-
dc.contributor.authorSu, Jing-
dc.contributor.authorHsu, Stanley-
dc.contributor.authorTang, Xiao-
dc.contributor.authorGerrits, Thomas-
dc.contributor.authorSlattery, Oliver-
dc.contributor.authorMa, Lijun-
dc.date.accessioned2026-02-03T09:00:21Z-
dc.date.available2026-02-03T09:00:21Z-
dc.date.created2026-02-02-
dc.date.issued2026-01-
dc.identifier.issn1094-4087-
dc.identifier.urihttps://pubs.kist.re.kr/handle/201004/154165-
dc.description.abstractAtomic vapor-cell quantum memories are key devices for quantum information science. Anti-relaxation coatings on the inner surface of the cell suppress ground-state dephasing caused by atom-wall collisions, thereby improving memory performance. Nevertheless, systematic performance comparisons of vapor-cell quantum memories with different anti-relaxation coatings under identical conditions remain limited. Here, we experimentally compare quantum-memory performance in cesium vapor cells with and without anti-relaxation coatings—uncoated, paraffin-coated, and alkene-coated—under otherwise identical conditions to assess coating-dependent effects. Using electromagnetically induced transparency (EIT) as the light storage protocol, we characterize transmission, memory efficiency, and storage lifetime. The alkene-coated cell yields the largest enhancement in retrieval efficiency—more than fourfold relative to the uncoated cell and more than twofold relative to the paraffin-coated cell—while exhibiting a modest (approximately 16%) increase in storage lifetime. These results provide a systematic benchmark for evaluating anti-relaxation coatings and for this instance, identify alkene coatings as an effective choice for improving retrieval efficiency in warm-vapor-cell memories.-
dc.languageEnglish-
dc.publisherOptical Society of America-
dc.titlePerformance comparison of quantum memories in cesium vapor cells with anti-relaxation coatings-
dc.typeArticle-
dc.identifier.doi10.1364/OE.579583-
dc.description.journalClass1-
dc.identifier.bibliographicCitationOptics Express, v.34, no.1, pp.1081 - 1088-
dc.citation.titleOptics Express-
dc.citation.volume34-
dc.citation.number1-
dc.citation.startPage1081-
dc.citation.endPage1088-
dc.description.isOpenAccessY-
dc.description.journalRegisteredClassscie-
dc.identifier.wosid001663514600003-
dc.identifier.scopusid2-s2.0-105027267153-
dc.relation.journalWebOfScienceCategoryOptics-
dc.relation.journalResearchAreaOptics-
dc.type.docTypeArticle-
dc.subject.keywordPlusELECTROMAGNETICALLY INDUCED TRANSPARENCY-
dc.subject.keywordPlusLIGHT-
dc.subject.keywordPlusSTORAGE-
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