Full metadata record
| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | Ghalgaoui, Ahmed | - |
| dc.contributor.author | Pilch, Patrick | - |
| dc.contributor.author | Kang, Taehee | - |
| dc.contributor.author | Runge, Matthias | - |
| dc.contributor.author | Kovalev, Sergey | - |
| dc.contributor.author | Yang, Yunkun | - |
| dc.contributor.author | Xiu, Faxian | - |
| dc.contributor.author | Wang, Zhe | - |
| dc.date.accessioned | 2026-02-04T08:31:01Z | - |
| dc.date.available | 2026-02-04T08:31:01Z | - |
| dc.date.created | 2026-02-02 | - |
| dc.date.issued | 2026-01 | - |
| dc.identifier.issn | 2469-9950 | - |
| dc.identifier.uri | https://pubs.kist.re.kr/handle/201004/154222 | - |
| dc.description.abstract | Unraveling light induced ultrafast dynamics in three-dimensional Dirac materials is crucial for deepening our fundamental understanding and for advancing potential optoelectronic applications. While time-resolved pump-probe spectroscopy has predominantly revealed carrier dynamics governed by Dirac fermion cooling and population inversion, the full picture of relaxation pathways remains incomplete. In this Letter, we identify a relaxation channel in these materials. Using strong terahertz (THz) field excitation combined with a near-infrared (NIR) probe, we detect a long-lived carrier population persisting on the nanosecond timescale. This extended lifetime suggests that carriers become trapped in defect states, leading to sub-band-gap absorption in the NIR and pointing to the significant role of defect-assisted relaxation in the carrier dynamics of Dirac semimetals. | - |
| dc.language | English | - |
| dc.publisher | AMER PHYSICAL SOC | - |
| dc.title | Light wave induced nanosecond-long persistent state in the Dirac semimetal Cd3As2 | - |
| dc.type | Article | - |
| dc.identifier.doi | 10.1103/yj4s-7ks7 | - |
| dc.description.journalClass | 1 | - |
| dc.identifier.bibliographicCitation | Physical Review B, v.113, no.4 | - |
| dc.citation.title | Physical Review B | - |
| dc.citation.volume | 113 | - |
| dc.citation.number | 4 | - |
| dc.description.isOpenAccess | Y | - |
| dc.description.journalRegisteredClass | scie | - |
| dc.identifier.wosid | 001659542800001 | - |
| dc.identifier.scopusid | 2-s2.0-105028504301 | - |
| dc.relation.journalWebOfScienceCategory | Materials Science, Multidisciplinary | - |
| dc.relation.journalWebOfScienceCategory | Physics, Applied | - |
| dc.relation.journalWebOfScienceCategory | Physics, Condensed Matter | - |
| dc.relation.journalResearchArea | Materials Science | - |
| dc.relation.journalResearchArea | Physics | - |
| dc.type.docType | Article | - |
| dc.subject.keywordPlus | ELECTRONIC-PROPERTIES | - |
| dc.subject.keywordPlus | GRAPHENE | - |
| dc.subject.keywordPlus | MOBILITY | - |
| dc.subject.keywordPlus | DEFECTS | - |
Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.