Search

Current filters:
Add filters:

Results 1-10 of 16 (Search time: 0.005 seconds).

Item hits:

Issue DateTitleAuthor(s)
-Performance Degradation and Microstructure Changes in Freeze-Thaw Cycling for PEMFC MEAs with Various Initial MicrostructuresJang, Jong Hyun; Lee, Sang Yeop; Hyoung-Juhn Kim; CHO, EUN AE; Dirk Henkensmeier; Lee Kug Seung; CHO, Min Kyung; I. Hang; Lim, Tae Hoon
-Improvement of PEMFC Performance by Optimization of the Decal ProcessCho, Hong Je; Jang Hyun-Sook; Im Seok Hui; CHO, EUN AE; Jang, Jong Hyun; Hyoung-Juhn Kim; Lim, Tae Hoon
-Performance degradation in freeze-thaw cycling for PEMFC MEAs with various initial microstructuresLee, Sang Yeop; Jang, Jong Hyun; CHO, Min Kyung; Hyoung-Juhn Kim; CHO, EUN AE; Lee Kug Seung; Lim, Tae Hoon; Hwang, In chul
-Durability study of PEMFC MEAsSunhwa.Kim.; Lee Byungseok; Lee, Hye-Jin; Lee Kug Seung; Hyoung-Juhn Kim; CHO, EUN AE; Dirk Henkensmeier; Jang, Jong Hyun
-Development of a galvanostatic analysis technique as an in-situ diagnostic tool for PEMFCsJang, Jong Hyun; 이국승; Lee Byungseok; Sung Jong Yoo; Hyoung-Juhn Kim; CHO, EUN AE; Dirk Henkensmeier; 김수길; Hwang Seung Jun; Lim, Tae Hoon
-Application of TGA techniques to analyze the MEA degradationJang, Jong Hyun; Lee, Hye-Jin; CHO, Min Kyung; Hyoung-Juhn Kim; CHO, EUN AE; 김수길; Dirk Henkensmeier; Sung Jong Yoo; Suk Woo Nam; Lim, Tae Hoon
-Development of PEMFC MEAs by catalyst-coated membrane (CCM) spraying methods for high performances and durabilityKun-Ho Kim; K.-Y. Lee; Hyoung-Juhn Kim; Lee, Sang Yeop; CHO, EUN AE; Lim, Tae Hoon; Hong, Seong Ahn; Yoon, Sung Pil; Dirk Henkensmeier; Jang, Jong Hyun
-Complex Capacitance Analysis of PEMFC and DMFC Catalyst LayersJang, Jong Hyun; Sunyeol Jeon; Soo-Kil Kim; CHO, EUN AE; Hyoung-Juhn Kim; Han, Jonghee; Lim, Tae Hoon
-Development of polysulfone-based electrolytes for PEMFC and DMFCJang, Jong Hyun; Dirk Henkensmeier; N. Nambi Krishnan; Hyoung-Juhn Kim; CHO, EUN AE; Kim Byoung Gak; Hong, Seong Ahn; Lim, Tae Hoon
-Ionic resistances of catalyst layers in PEMFC by complex capacitance analysis of impedance dataJang, Jong Hyun; Sunyeol Jeon; Soo-Kil Kim; Hyoung-Juhn Kim; CHO, EUN AE; Han, Jonghee; Lim, Tae Hoon

Discover

BROWSE