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Issue Date
Title
Author(s)
1999-12-15
Mechanism maps for electromigration-induced failure of metal and alloy interconnects
Andleigh, VK
;
Srikar, VT
;
Park, YJ
;
Thompson, CV
1999-04-01
Simulations of stress evolution and the current density scaling of electromigration-induced failure times in pure and alloyed interconnects
Park, YJ
;
Andleigh, VK
;
Thompson, CV
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-Author
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Park, YJ
2
Thompson, CV
1
Srikar, VT
-Subject
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DAMAGE
2
electromigration
2
MICROSTRUCTURE
2
PASSIVATED AL LINES
2
RELIABILITY
2
VOIDS
1
ALUMINUM
1
BAMBOO LINES
1
computer simulation
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CONDUCTORS
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1999
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