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dc.contributor.author유의상-
dc.contributor.author유용상-
dc.contributor.author송현석-
dc.contributor.author정철현-
dc.date.accessioned2024-01-12T02:40:07Z-
dc.date.available2024-01-12T02:40:07Z-
dc.date.issued2021-03-24-
dc.identifier.urihttps://pubs.kist.re.kr/handle/201004/76140-
dc.title극성 용매의 웨팅이 가능한 나노 광학 센서 및 이를 활용한 극성 용매 분석 방법-
dc.typePatent-
dc.date.registration2021-03-24-
dc.date.application2019-07-17-
dc.identifier.patentRegistrationNumber10-2233627-
dc.identifier.patentApplicationNumber10-2019-0086228-
dc.publisher.countryKO-
dc.type.iprs특허-
dc.contributor.assignee한국과학기술연구원-
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KIST Patent > Others
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