Full metadata record

DC Field Value Language
dc.contributor.author조영욱-
dc.contributor.author김용수-
dc.contributor.author이상윤-
dc.contributor.author김윤호-
dc.contributor.author문성욱-
dc.contributor.author김요셉-
dc.contributor.author한상욱-
dc.date.accessioned2024-01-12T02:41:52Z-
dc.date.available2024-01-12T02:41:52Z-
dc.date.issued2020-04-01-
dc.identifier.urihttps://pubs.kist.re.kr/handle/201004/76220-
dc.title양자 프로세스 분석 장치 및 방법-
dc.typePatent-
dc.date.registration2020-04-01-
dc.date.application2018-04-12-
dc.identifier.patentRegistrationNumber10-2098285-
dc.identifier.patentApplicationNumber10-2018-0042831-
dc.publisher.countryKO-
dc.type.iprs특허-
dc.contributor.assignee한국과학기술연구원-
Appears in Collections:
KIST Patent > Others
Files in This Item:
There are no files associated with this item.
Export
RIS (EndNote)
XLS (Excel)
XML

qrcode

Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.

BROWSE