DSpace at KISTKIST PatentOthers

Full metadata record

DC Field Value Language
dc.contributor.author서민아-
dc.contributor.author이동규-
dc.contributor.author전영민-
dc.contributor.author이택진-
dc.contributor.author김재헌-
dc.contributor.author김철기-
dc.date.accessioned2024-01-12T03:36:56Z-
dc.date.available2024-01-12T03:36:56Z-
dc.date.issued2017-12-05-
dc.identifier.urihttps://pubs.kist.re.kr/handle/201004/76959-
dc.title나노 메타물질 기반 테라헤르츠 전자기파를 이용한 고민감도 잔류량 검출방법 및 이에 사용되는 디바이스-
dc.typePatent-
dc.date.registration2017-12-05-
dc.date.application2016-03-24-
dc.identifier.patentRegistrationNumber9,835,553-
dc.identifier.patentApplicationNumber15/079,996-
dc.publisher.countryUS-
dc.type.iprs특허-
dc.contributor.assignee한국과학기술연구원-
Appears in Collections:
KIST Patent > Others
Files in This Item:
There are no files associated with this item.
Export
RIS (EndNote)
XLS (Excel)
XML
Show Simple Item Record

qrcode

Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.

BROWSE