DSpace at KISTKIST PatentOthers

Full metadata record

DC Field Value Language
dc.contributor.author한준현-
dc.contributor.author변지영-
dc.contributor.author지광구-
dc.contributor.author김윤배-
dc.date.accessioned2024-01-12T04:04:39Z-
dc.date.available2024-01-12T04:04:39Z-
dc.date.issued2012-04-13-
dc.identifier.urihttps://pubs.kist.re.kr/handle/201004/77608-
dc.title플렉서블 기판상의 금속층 두께 측정방법-
dc.typePatent-
dc.date.registration2012-04-13-
dc.date.application2010-04-12-
dc.identifier.patentRegistrationNumber4970567-
dc.identifier.patentApplicationNumber2010-091275-
dc.publisher.countryJA-
dc.type.iprs특허-
dc.contributor.assignee한국과학기술연구원-
Appears in Collections:
KIST Patent > Others
Files in This Item:
There are no files associated with this item.
Export
RIS (EndNote)
XLS (Excel)
XML
Show Simple Item Record

qrcode

Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.

BROWSE