DSpace at KISTKIST PatentOthers

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dc.contributor.author강성철-
dc.contributor.author서승범-
dc.contributor.author이우섭-
dc.contributor.author최혁렬-
dc.date.accessioned2024-01-12T04:30:51Z-
dc.date.available2024-01-12T04:30:51Z-
dc.date.issued2011-11-16-
dc.identifier.urihttps://pubs.kist.re.kr/handle/201004/77995-
dc.title질감 측정 장치 및 그 방법-
dc.typePatent-
dc.date.registration2011-11-16-
dc.date.application2008-07-10-
dc.identifier.patentRegistrationNumberZL200810130582.X-
dc.identifier.patentApplicationNumber200810130582.X-
dc.publisher.countryCC-
dc.type.iprs특허-
dc.contributor.assignee한국과학기술연구원-
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