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dc.contributor.author양은경-
dc.contributor.author김정환-
dc.contributor.author김태송-
dc.contributor.author조한상-
dc.contributor.author강지윤-
dc.contributor.author신현준-
dc.contributor.author주병권-
dc.date.accessioned2024-01-12T04:34:49Z-
dc.date.available2024-01-12T04:34:49Z-
dc.date.issued2008-09-23-
dc.identifier.urihttps://pubs.kist.re.kr/handle/201004/78163-
dc.title랩온어칩에서의 형광 편광 측정 방법-
dc.typePatent-
dc.date.registration2008-09-23-
dc.date.application2006-06-05-
dc.identifier.patentRegistrationNumber7,427,509-
dc.identifier.patentApplicationNumber11/422,142-
dc.publisher.countryUS-
dc.type.iprs특허-
dc.contributor.assignee한국과학기술연구원-
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