Full metadata record
DC Field | Value | Language |
---|---|---|
dc.contributor.author | 전영민 | - |
dc.contributor.author | 박준 | - |
dc.contributor.author | 김재헌 | - |
dc.contributor.author | 우덕하 | - |
dc.contributor.author | 김철기 | - |
dc.contributor.author | 이택진 | - |
dc.contributor.author | 서민아 | - |
dc.date.accessioned | 2024-01-12T06:45:51Z | - |
dc.date.available | 2024-01-12T06:45:51Z | - |
dc.date.issued | 2017-04-24 | - |
dc.identifier.uri | https://pubs.kist.re.kr/handle/201004/80155 | - |
dc.title | 디스플레이 검사 장치 및 방법 | - |
dc.type | Patent | - |
dc.date.registration | 2017-04-24 | - |
dc.date.application | 2015-09-08 | - |
dc.identifier.patentRegistrationNumber | 10-1731498 | - |
dc.identifier.patentApplicationNumber | 2015-0127024 | - |
dc.publisher.country | KO | - |
dc.type.iprs | 특허 | - |
dc.contributor.assignee | 한국과학기술연구원 | - |
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