Full metadata record

DC Field Value Language
dc.contributor.authorKim, Kwang Seok-
dc.contributor.authorChun, Myung-Suk-
dc.contributor.authorByun, Y.T.-
dc.contributor.authorWoo, D.H.-
dc.date.accessioned2024-01-12T06:55:10Z-
dc.date.available2024-01-12T06:55:10Z-
dc.date.created2022-03-07-
dc.date.issued2013-05-
dc.identifier.issn0000-0000-
dc.identifier.urihttps://pubs.kist.re.kr/handle/201004/80355-
dc.description.abstractThe secondary flow motion that is induced by curvature of microscale channel is thoroughly studied with simulation and experimental validation. The steady-state solution of the electroosmotic flow is achieved by applying the full Poisson-Boltzmann and the Navier-Stokes equations that are associated throughout the whole domain of the rectangular microchannel, made of either glass only or glass and polydimethylsiloxane. At the hydrophobic surface with curvature, the generalized Navier's slip boundary condition is applied. The particle streak velocimetry is performed by using an inverted epi-fluorescence microscope with tracer particle, which provides experimental verifications. We visualize the flow in a curved microchannel and compare the results with the simulation. Based on the agreements, it is concluded that our simulations exactly represent the curvature induced secondary flow, and are able to provide standard predictor for the relevant applications.-
dc.languageEnglish-
dc.publisherNSTI-
dc.titleSecondary microflows in electrokinetic transport with hydrodynamic slippage effect-
dc.typeConference-
dc.description.journalClass1-
dc.identifier.bibliographicCitationNanotechnology 2013: Electronics, Devices, Fabrication, MEMS, Fluidics and Computational - 2013 NSTI Nanotechnology Conference and Expo, NSTI-Nanotech 2013, pp.281 - 284-
dc.citation.titleNanotechnology 2013: Electronics, Devices, Fabrication, MEMS, Fluidics and Computational - 2013 NSTI Nanotechnology Conference and Expo, NSTI-Nanotech 2013-
dc.citation.startPage281-
dc.citation.endPage284-
dc.citation.conferencePlaceUS-
dc.citation.conferencePlaceWashington, DC-
dc.citation.conferenceDate2013-05-12-
dc.relation.isPartOfTechnical Proceedings of the 2013 NSTI Nanotechnology Conference and Expo, NSTI-Nanotech 2013-
dc.identifier.scopusid2-s2.0-84881091491-
Appears in Collections:
KIST Conference Paper > 2013
Files in This Item:
There are no files associated with this item.
Export
RIS (EndNote)
XLS (Excel)
XML

qrcode

Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.

BROWSE