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dc.contributor.authorAhn, Jae Pyoung-
dc.date.accessioned2024-01-12T07:24:52Z-
dc.date.available2024-01-12T07:24:52Z-
dc.date.created2022-01-14-
dc.date.issued2008-11-
dc.identifier.urihttps://pubs.kist.re.kr/handle/201004/80989-
dc.languageEnglish-
dc.publisher자기조립학회-
dc.titleEffect of Rapid Thermal Annealing on Electrical Conductivity of ZnO Single Nanowire Device manufactured by FIB-
dc.typeConference-
dc.description.journalClass1-
dc.identifier.bibliographicCitationSelf Assembly Processes and Materials : Applicaitons in future memory-
dc.citation.titleSelf Assembly Processes and Materials : Applicaitons in future memory-
dc.citation.conferencePlaceKO-
dc.citation.conferenceDate2008-11-26-
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KIST Conference Paper > 2008
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