DSpace at KISTKIST Patent2003

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dc.contributor.author한승희-
dc.contributor.author이연희-
dc.contributor.author김영우-
dc.date.accessioned2024-01-12T08:05:04Z-
dc.date.available2024-01-12T08:05:04Z-
dc.date.issued2006-09-18-
dc.identifier.urihttps://pubs.kist.re.kr/handle/201004/81621-
dc.title펄스 플라즈마 특성 변수 측정용 진단 시스템 및 방법-
dc.typePatent-
dc.date.registration2006-09-18-
dc.date.application2003-09-16-
dc.identifier.patentRegistrationNumber0627752-
dc.identifier.patentApplicationNumber2003-0064027-
dc.publisher.countryKO-
dc.type.iprs특허-
dc.contributor.assignee한국과학기술연구원-
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KIST Patent > 2003
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