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dc.contributor.author유범재-
dc.contributor.author오상록-
dc.contributor.author이두현-
dc.contributor.author권인소-
dc.date.accessioned2024-01-12T08:07:59Z-
dc.date.available2024-01-12T08:07:59Z-
dc.date.issued2003-03-25-
dc.identifier.urihttps://pubs.kist.re.kr/handle/201004/81756-
dc.title반도체　패키지의　삼차원　시각　검사방법　및　장치-
dc.typePatent-
dc.date.registration2003-03-25-
dc.date.application2000-10-27-
dc.identifier.patentRegistrationNumber378988-
dc.identifier.patentApplicationNumber00-63402-
dc.publisher.countryKO-
dc.type.iprs특허-
dc.contributor.assignee한국과학기술연구원-
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KIST Patent > 2000
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