Full metadata record
| DC Field | Value | Language |
|---|---|---|
| dc.date.accessioned | 2024-01-12T08:18:46Z | - |
| dc.date.available | 2024-01-12T08:18:46Z | - |
| dc.date.created | 2022-01-14 | - |
| dc.date.issued | 2004-11-01 | - |
| dc.identifier.uri | https://pubs.kist.re.kr/handle/201004/82110 | - |
| dc.title | Measurement of complex permittivity of thin PCB substrate using open-ended coaxial probe | - |
| dc.type | Conference | - |
| dc.description.journalClass | 1 | - |
| dc.identifier.bibliographicCitation | KEES, pp.155 - 158 | - |
| dc.citation.title | KEES | - |
| dc.citation.startPage | 155 | - |
| dc.citation.endPage | 158 | - |
| dc.relation.isPartOf | Proc. KJJC-EMTC - 직접입력 | - |
- Appears in Collections:
- KIST Conference Paper > 2004
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