Full metadata record
| DC Field | Value | Language | 
|---|---|---|
| dc.contributor.author | 강민구 | - | 
| dc.contributor.author | 조대용 | - | 
| dc.contributor.author | 박민규 | - | 
| dc.date.accessioned | 2024-01-12T08:38:57Z | - | 
| dc.date.available | 2024-01-12T08:38:57Z | - | 
| dc.date.issued | 2023-03-13 | - | 
| dc.identifier.uri | https://pubs.kist.re.kr/handle/201004/82362 | - | 
| dc.title | 응시 깊이 정보 추정 장치 및 방법 | - | 
| dc.type | Patent | - | 
| dc.date.registration | 2023-03-13 | - | 
| dc.date.application | 2021-05-24 | - | 
| dc.identifier.patentRegistrationNumber | 10-2511078 | - | 
| dc.identifier.patentApplicationNumber | 10-2021-0066109 | - | 
| dc.publisher.country | KO | - | 
| dc.type.iprs | 특허 | - | 
| dc.contributor.assignee | 한국과학기술연구원 | - | 
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