Full metadata record
| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | 전명석 | - |
| dc.date.accessioned | 2024-01-12T08:39:18Z | - |
| dc.date.available | 2024-01-12T08:39:18Z | - |
| dc.date.issued | 2023-08-07 | - |
| dc.identifier.uri | https://pubs.kist.re.kr/handle/201004/82379 | - |
| dc.title | 전해질고분자 브러쉬층의 그래프팅 밀도 산출 방법 및 시스템 | - |
| dc.type | Patent | - |
| dc.date.registration | 2023-08-07 | - |
| dc.date.application | 2020-11-30 | - |
| dc.identifier.patentRegistrationNumber | 10-2564147 | - |
| dc.identifier.patentApplicationNumber | 10-2020-0164822 | - |
| dc.publisher.country | KO | - |
| dc.type.iprs | 특허 | - |
| dc.contributor.assignee | 한국과학기술연구원 | - |
- Appears in Collections:
- KIST Patent > 2020
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