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dc.contributor.authorCHOI KI YONG-
dc.contributor.authorDuck-kyun Choi-
dc.contributor.authorJi-Yeun Park-
dc.contributor.authorYoon, Dae Sung-
dc.contributor.authorKim, Tae Song-
dc.date.accessioned2024-01-12T08:44:18Z-
dc.date.available2024-01-12T08:44:18Z-
dc.date.created2021-09-29-
dc.date.issued2004-04-
dc.identifier.urihttps://pubs.kist.re.kr/handle/201004/82582-
dc.languageEnglish-
dc.subjectSiC membrane-
dc.subjectPZT-PCW-
dc.subjectelectrical property-
dc.subjectstructural stability-
dc.titleElectrical properties of PZT-PCW thick film on Pt/SiC/Si, and structural stability of SiCas buffer layer-
dc.typeConference-
dc.description.journalClass1-
dc.identifier.bibliographicCitationISIF 2004-
dc.citation.titleISIF 2004-
dc.citation.conferencePlaceUS-
dc.citation.conferenceDate2004-04-
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KIST Conference Paper > 2004
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