DSpace at KISTKIST Patent2016

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dc.contributor.author권범진-
dc.contributor.author김진상-
dc.contributor.author백승협-
dc.contributor.author강민수-
dc.contributor.author최지원-
dc.contributor.author강종윤-
dc.contributor.author노임준-
dc.contributor.author김성근-
dc.date.accessioned2024-01-12T09:08:36Z-
dc.date.available2024-01-12T09:08:36Z-
dc.date.issued2018-04-05-
dc.identifier.urihttps://pubs.kist.re.kr/handle/201004/82978-
dc.title열전 반도체의 열전도도 및 열전 성능지수 측정방법-
dc.typePatent-
dc.date.registration2018-04-05-
dc.date.application2016-11-14-
dc.identifier.patentRegistrationNumber10-1848012-
dc.identifier.patentApplicationNumber10-2016-0151113-
dc.publisher.countryKO-
dc.type.iprs특허-
dc.contributor.assignee한국과학기술연구원-
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KIST Patent > 2016
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