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dc.contributor.author정성필-
dc.contributor.author이석헌-
dc.contributor.author구헌철-
dc.contributor.author윤택근-
dc.date.accessioned2024-01-12T09:30:56Z-
dc.date.available2024-01-12T09:30:56Z-
dc.date.issued2016-08-25-
dc.identifier.urihttps://pubs.kist.re.kr/handle/201004/83351-
dc.title막 오염 정도 결정 방법-
dc.typePatent-
dc.date.registration2016-08-25-
dc.date.application2015-05-21-
dc.identifier.patentRegistrationNumber10-1652685-
dc.identifier.patentApplicationNumber2015-0070826-
dc.publisher.countryKO-
dc.type.iprs특허-
dc.contributor.assignee한국과학기술연구원-
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KIST Patent > 2015
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