DSpace at KISTKIST Patent2006

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dc.contributor.author오영주-
dc.contributor.author송귀은-
dc.contributor.author홍경태-
dc.contributor.author옥명렬-
dc.date.accessioned2024-01-12T10:06:25Z-
dc.date.available2024-01-12T10:06:25Z-
dc.date.issued2007-09-10-
dc.identifier.urihttps://pubs.kist.re.kr/handle/201004/84166-
dc.title플라즈마 전해 산화법에 사용되는 전해질 내 ＳｉＯ₂농도의 분석방법 및 이를 이용한 전해질의 수명연장방법-
dc.typePatent-
dc.date.registration2007-09-10-
dc.date.application2006-09-27-
dc.identifier.patentRegistrationNumber0758895-
dc.identifier.patentApplicationNumber2006-0094430-
dc.publisher.countryKO-
dc.type.iprs특허-
dc.contributor.assignee한국과학기술연구원-
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KIST Patent > 2006
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